Graphite oxide Auger-electron diagnostics

V. M. Mikoushkin; A. S. Kriukov; V. V. Shnitov; A. P. Solonitsyna; A. T. Dideykin; D. A. Sakseev; O. Yu. Vilkov; Ventsislav Lavchiev

doi:10.1016/j.elspec.2015.01.001

Graphite oxide Auger-electron diagnostics

V. M. Mikoushkin, A. S. Kriukov, V. V. Shnitov, A. P. Solonitsyna, A. T. Dideykin, D. A. Sakseev, O. Yu. Vilkov, Ventsislav Lavchiev

Institute of Microelectronics and Microsensors

Research output: Contribution to journal › Article › peer-review

Abstract

Graphite oxide (GO) nanofilms on the SiO2/Si surface have been studied by photoelectron spectroscopy (XPS) with synchrotron radiation and by Auger electron spectroscopy (AES). Auger electron energies were determined for the basic functional GO groups: hydroxyl (C OH) and epoxide (C O C). The data obtained enabled developing a technique for the GO chemical and elemental composition determination. The technique allows controlling the hydrogen content in GO despite the impossibility of Auger emission from hydrogen.

Original language	English
Pages (from-to)	51-55
Number of pages	5
Journal	Journal of Electron Spectroscopy and Related Phenomena
Volume	199
Issue number	199
DOIs	https://doi.org/10.1016/j.elspec.2015.01.001
Publication status	Published - Jan 2015

Fields of science

202019 High frequency engineering
202021 Industrial electronics
202036 Sensor systems
203017 Micromechanics
202 Electrical Engineering, Electronics, Information Engineering
202027 Mechatronics
202028 Microelectronics
202037 Signal processing

JKU Focus areas

Mechatronics and Information Processing
Nano-, Bio- and Polymer-Systems: From Structure to Function

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10.1016/j.elspec.2015.01.001

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@article{569f3d5c2de145e58e97718ab991964a,

title = "Graphite oxide Auger-electron diagnostics",

abstract = "Graphite oxide (GO) nanofilms on the SiO2/Si surface have been studied by photoelectron spectroscopy (XPS) with synchrotron radiation and by Auger electron spectroscopy (AES). Auger electron energies were determined for the basic functional GO groups: hydroxyl (C OH) and epoxide (C O C). The data obtained enabled developing a technique for the GO chemical and elemental composition determination. The technique allows controlling the hydrogen content in GO despite the impossibility of Auger emission from hydrogen.",

author = "Mikoushkin, {V. M.} and Kriukov, {A. S.} and Shnitov, {V. V.} and Solonitsyna, {A. P.} and Dideykin, {A. T.} and Sakseev, {D. A.} and Vilkov, {O. Yu.} and Ventsislav Lavchiev",

year = "2015",

month = jan,

doi = "10.1016/j.elspec.2015.01.001",

language = "English",

volume = "199",

pages = "51--55",

journal = "Journal of Electron Spectroscopy and Related Phenomena",

issn = "1873-2526",

publisher = "Elsevier",

number = "199",

}

TY - JOUR

T1 - Graphite oxide Auger-electron diagnostics

AU - Mikoushkin, V. M.

AU - Kriukov, A. S.

AU - Shnitov, V. V.

AU - Solonitsyna, A. P.

AU - Dideykin, A. T.

AU - Sakseev, D. A.

AU - Vilkov, O. Yu.

AU - Lavchiev, Ventsislav

PY - 2015/1

Y1 - 2015/1

N2 - Graphite oxide (GO) nanofilms on the SiO2/Si surface have been studied by photoelectron spectroscopy (XPS) with synchrotron radiation and by Auger electron spectroscopy (AES). Auger electron energies were determined for the basic functional GO groups: hydroxyl (C OH) and epoxide (C O C). The data obtained enabled developing a technique for the GO chemical and elemental composition determination. The technique allows controlling the hydrogen content in GO despite the impossibility of Auger emission from hydrogen.

AB - Graphite oxide (GO) nanofilms on the SiO2/Si surface have been studied by photoelectron spectroscopy (XPS) with synchrotron radiation and by Auger electron spectroscopy (AES). Auger electron energies were determined for the basic functional GO groups: hydroxyl (C OH) and epoxide (C O C). The data obtained enabled developing a technique for the GO chemical and elemental composition determination. The technique allows controlling the hydrogen content in GO despite the impossibility of Auger emission from hydrogen.

UR - http://www.scopus.com/inward/record.url?scp=84923239950&partnerID=8YFLogxK

U2 - 10.1016/j.elspec.2015.01.001

DO - 10.1016/j.elspec.2015.01.001

M3 - Article

SN - 1873-2526

VL - 199

SP - 51

EP - 55

JO - Journal of Electron Spectroscopy and Related Phenomena

JF - Journal of Electron Spectroscopy and Related Phenomena

IS - 199

ER -

Graphite oxide Auger-electron diagnostics

Abstract

Fields of science

JKU Focus areas

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