Frequency Analysis of Dopant Profiling and Capacitance Spectroscopy Using Scanning Microwave Microscopy

Enrico Brinciotti; Giulio Maria Campagnaro; Giorgio Badino; Manuel Kasper; Georg Gramse; Silviu Sorin Tuca; J. Smoliner; Thomas Schweinboeck; Soeren Hommel; Ferry Kienberger

doi:10.1109/TNANO.2016.2628206

Frequency Analysis of Dopant Profiling and Capacitance Spectroscopy Using Scanning Microwave Microscopy

Enrico Brinciotti
, Giulio Maria Campagnaro
, Giorgio Badino
, Manuel Kasper
, Georg Gramse
, Silviu Sorin Tuca
, J. Smoliner
, Thomas Schweinboeck
, Soeren Hommel
, Ferry Kienberger

Department of Applied Experimental Biophysics

Research output: Chapter in Book/Report/Conference proceeding › Conference proceedings › peer-review

Original language	English
Title of host publication	IEEE Transactions on Nanotechnology
Publisher	IEEE
Pages	75-82
Number of pages	8
Volume	16
Edition	1
DOIs	https://doi.org/10.1109/TNANO.2016.2628206
Publication status	Published - Jan 2017

Publication series

Name	IEEE Transactions on Nanotechnology
ISSN (Print)	1536-125X

Fields of science

103 Physics, Astronomy
106006 Biophysics

JKU Focus areas

Engineering and Natural Sciences (in general)

Access to Document

10.1109/TNANO.2016.2628206

Cite this

Brinciotti, E., Campagnaro, G. M., Badino, G., Kasper, M., Gramse, G., Tuca, S. S., Smoliner, J., Schweinboeck, T., Hommel, S., & Kienberger, F. (2017). Frequency Analysis of Dopant Profiling and Capacitance Spectroscopy Using Scanning Microwave Microscopy. In IEEE Transactions on Nanotechnology (1 ed., Vol. 16, pp. 75-82). (IEEE Transactions on Nanotechnology). IEEE. https://doi.org/10.1109/TNANO.2016.2628206

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title = "Frequency Analysis of Dopant Profiling and Capacitance Spectroscopy Using Scanning Microwave Microscopy",

author = "Enrico Brinciotti and Campagnaro, \{Giulio Maria\} and Giorgio Badino and Manuel Kasper and Georg Gramse and Tuca, \{Silviu Sorin\} and J. Smoliner and Thomas Schweinboeck and Soeren Hommel and Ferry Kienberger",

year = "2017",

month = jan,

doi = "10.1109/TNANO.2016.2628206",

language = "English",

volume = "16",

series = "IEEE Transactions on Nanotechnology",

publisher = "IEEE",

pages = "75--82",

booktitle = "IEEE Transactions on Nanotechnology",

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Brinciotti, E, Campagnaro, GM, Badino, G, Kasper, M, Gramse, G, Tuca, SS, Smoliner, J, Schweinboeck, T, Hommel, S & Kienberger, F 2017, Frequency Analysis of Dopant Profiling and Capacitance Spectroscopy Using Scanning Microwave Microscopy. in IEEE Transactions on Nanotechnology. 1 edn, vol. 16, IEEE Transactions on Nanotechnology, IEEE, pp. 75-82. https://doi.org/10.1109/TNANO.2016.2628206

Frequency Analysis of Dopant Profiling and Capacitance Spectroscopy Using Scanning Microwave Microscopy. / Brinciotti, Enrico; Campagnaro, Giulio Maria; Badino, Giorgio et al.
IEEE Transactions on Nanotechnology. Vol. 16 1. ed. IEEE, 2017. p. 75-82 (IEEE Transactions on Nanotechnology).

Research output: Chapter in Book/Report/Conference proceeding › Conference proceedings › peer-review

TY - GEN

T1 - Frequency Analysis of Dopant Profiling and Capacitance Spectroscopy Using Scanning Microwave Microscopy

AU - Brinciotti, Enrico

AU - Campagnaro, Giulio Maria

AU - Badino, Giorgio

AU - Kasper, Manuel

AU - Gramse, Georg

AU - Tuca, Silviu Sorin

AU - Smoliner, J.

AU - Schweinboeck, Thomas

AU - Hommel, Soeren

AU - Kienberger, Ferry

PY - 2017/1

Y1 - 2017/1

UR - https://www.scopus.com/pages/publications/85014306212

U2 - 10.1109/TNANO.2016.2628206

DO - 10.1109/TNANO.2016.2628206

M3 - Conference proceedings

VL - 16

T3 - IEEE Transactions on Nanotechnology

SP - 75

EP - 82

BT - IEEE Transactions on Nanotechnology

PB - IEEE

ER -

Frequency Analysis of Dopant Profiling and Capacitance Spectroscopy Using Scanning Microwave Microscopy

Publication series

Fields of science

JKU Focus areas

Access to Document

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