Frequency Analysis of Dopant Profiling and Capacitance Spectroscopy Using Scanning Microwave Microscopy

  • Enrico Brinciotti
  • , Giulio Maria Campagnaro
  • , Giorgio Badino
  • , Manuel Kasper
  • , Georg Gramse
  • , Silviu Sorin Tuca
  • , J. Smoliner
  • , Thomas Schweinboeck
  • , Soeren Hommel
  • , Ferry Kienberger

Research output: Chapter in Book/Report/Conference proceedingConference proceedingspeer-review

Original languageEnglish
Title of host publicationIEEE Transactions on Nanotechnology
PublisherIEEE
Pages75-82
Number of pages8
Volume16
DOIs
Publication statusPublished - Jan 2017

Fields of science

  • 103 Physics, Astronomy
  • 106006 Biophysics

JKU Focus areas

  • Engineering and Natural Sciences (in general)

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