Evidence of stacking-fault distribution along an InAs nanowire using micro-focused coherent X-ray diffraction

  • Virginie Chamard
  • , Julian Stangl
  • , S. Labat
  • , Bernhard Mandl
  • , Rainer T. Lechner
  • , Till Hartmut Metzger

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Pages (from-to)272-280
Number of pages9
JournalJournal of Applied Crystallography
Volume41
Issue number2
DOIs
Publication statusPublished - 08 Mar 2008

Fields of science

  • 103 Physics, Astronomy
  • 103009 Solid state physics
  • 103011 Semiconductor physics
  • 103017 Magnetism
  • 103018 Materials physics
  • 103040 Photonics
  • 202032 Photovoltaics
  • 210006 Nanotechnology

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