Evidence of stacking fault distribution along an InAs nanowire using micro-focussed coherent x-ray diffraction

Virginie Chamard, Julian Stangl, S. Labat, Bernhard Mandl, Rainer T. Lechner, Till Hartmut Metzger

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	272-280
Number of pages	9
Journal	Journal of Applied Crystallography
Volume	41
DOIs	https://doi.org/10.1107/s0021889808001167
Publication status	Published - 2008

Fields of science

@article{c8860491e12e4780b96062341b8fee16,

title = "Evidence of stacking fault distribution along an InAs nanowire using micro-focussed coherent x-ray diffraction",

author = "Virginie Chamard and Julian Stangl and S. Labat and Bernhard Mandl and Lechner, \{Rainer T.\} and Metzger, \{Till Hartmut\}",

year = "2008",

doi = "10.1107/s0021889808001167",

language = "English",

volume = "41",

pages = "272--280",

journal = "Journal of Applied Crystallography",

issn = "1600-5767",

}

TY - JOUR

T1 - Evidence of stacking fault distribution along an InAs nanowire using micro-focussed coherent x-ray diffraction

AU - Chamard, Virginie

AU - Stangl, Julian

AU - Labat, S.

AU - Mandl, Bernhard

AU - Lechner, Rainer T.

AU - Metzger, Till Hartmut

PY - 2008

Y1 - 2008

U2 - 10.1107/s0021889808001167

DO - 10.1107/s0021889808001167

M3 - Article

SN - 1600-5767

VL - 41

SP - 272

EP - 280

JO - Journal of Applied Crystallography

JF - Journal of Applied Crystallography

ER -