Evidence for screening breakdown near the metal-to-insulator transition in two dimensions

Research output: Chapter in Book/Report/Conference proceeding › Conference proceedings › peer-review

Original language	English
Title of host publication	Proceedings of the 25th International Conference on the Physics of Semiconductors Part I
Pages	859-860
Volume	87
Publication status	Published - 2001

Name	Springer Proceedings in Physics

Fields of science

This output contributes to the following UN Sustainable Development Goals (SDGs)

@inproceedings{0e7ddf7d9c864ed1b4ec4d882d81f686,

title = "Evidence for screening breakdown near the metal-to-insulator transition in two dimensions",

author = "Wolfgang Jantsch and N. Sandersfeld and Friedrich Sch{\"a}ffler and Z. Wilamowski",

year = "2001",

language = "English",

volume = "87",

series = "Springer Proceedings in Physics",

pages = "859--860",

booktitle = "Proceedings of the 25th International Conference on the Physics of Semiconductors Part I",

}

Evidence for screening breakdown near the metal-to-insulator transition in two dimensions. / Jantsch, Wolfgang; Sandersfeld, N.; Schäffler, Friedrich et al.
Proceedings of the 25th International Conference on the Physics of Semiconductors Part I. Vol. 87 2001. p. 859-860 (Springer Proceedings in Physics).

Research output: Chapter in Book/Report/Conference proceeding › Conference proceedings › peer-review

TY - GEN

T1 - Evidence for screening breakdown near the metal-to-insulator transition in two dimensions

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AU - Sandersfeld, N.

AU - Schäffler, Friedrich

AU - Wilamowski, Z.

PY - 2001

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UR - https://link.springer.com/book/9783642639937

M3 - Conference proceedings

VL - 87

T3 - Springer Proceedings in Physics

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EP - 860

BT - Proceedings of the 25th International Conference on the Physics of Semiconductors Part I

ER -