Evaluation of growth temperature, refractive index, and layer thickness of thin ZnTe, MnTe, and CdTe films by in situ visible laser interferometry

W. Faschinger; G.J. Glanner; M.A. Herman; Helmut Sitter

doi:10.1063/1.112174

Evaluation of growth temperature, refractive index, and layer thickness of thin ZnTe, MnTe, and CdTe films by in situ visible laser interferometry

W. Faschinger, G.J. Glanner, M.A. Herman, Helmut Sitter

Research output: Contribution to journal › Article › peer-review

Original language	English
Journal	Applied Physics Letters
DOIs	https://doi.org/10.1063/1.112174
Publication status	Published - 1994

Fields of science

103 Physics, Astronomy
103009 Solid state physics
103011 Semiconductor physics
103017 Magnetism
103018 Materials physics
103040 Photonics
202032 Photovoltaics
210006 Nanotechnology

Access to Document

10.1063/1.112174

Cite this

@article{48c78a25aa484846bd393f2907b227b3,

title = "Evaluation of growth temperature, refractive index, and layer thickness of thin ZnTe, MnTe, and CdTe films by in situ visible laser interferometry",

author = "W. Faschinger and G.J. Glanner and M.A. Herman and Helmut Sitter",

year = "1994",

doi = "10.1063/1.112174",

language = "English",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics",

}

TY - JOUR

T1 - Evaluation of growth temperature, refractive index, and layer thickness of thin ZnTe, MnTe, and CdTe films by in situ visible laser interferometry

AU - Faschinger, W.

AU - Glanner, G.J.

AU - Herman, M.A.

AU - Sitter, Helmut

PY - 1994

Y1 - 1994

U2 - 10.1063/1.112174

DO - 10.1063/1.112174

M3 - Article

SN - 0003-6951

JO - Applied Physics Letters

JF - Applied Physics Letters

ER -