Ellipsometry as a Nondestructive Depth Profiling Tool for Roll-to-Roll Manufactured Flexible Solar Cells

Morten V. Madsen, Kristian Sylvester-Hvid, B. Dastmalchi, Kurt Hingerl, Kion Norrman, Thomas Tromholt, Matthieu Manceau, Dechan Angmo, FC Krebs

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Number of pages6
JournalThe Journal of Physical Chemistry C
Volume115
Issue number10817-10822
DOIs
Publication statusPublished - 2011

Fields of science

  • 103 Physics, Astronomy
  • 103020 Surface physics
  • 103021 Optics
  • 210006 Nanotechnology

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