Electroreflectance Spectroscopy of Strained Si 1-xGex Layers on Silicon

Thomas Ebner, H.-J. Herzog, R. Sauer, Friedrich Schäffler, K. Thonke

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
JournalPhysical Review B
Publication statusPublished - 1998

Fields of science

  • 103 Physics, Astronomy
  • 103009 Solid state physics
  • 103011 Semiconductor physics
  • 103017 Magnetism
  • 103018 Materials physics
  • 103040 Photonics
  • 202032 Photovoltaics
  • 210006 Nanotechnology

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