Einfluss von Stützkapazitäten auf die Soft Failures von Integrierten Schaltungen bei ESD Events

Translated title of the contribution: Influence of Decoupling Capacitors on Soft Failures of Integrated Circuits during ESD Events

Research output: Chapter in Book/Report/Conference proceedingConference proceedingspeer-review

Abstract

Decoupling capacitors are appropriate measure in the field of electromagnetic compatibility (EMC) both externally (off-chip) and internally (on-chip) to reduce the electromagnetic emission of an integrated circuit. This article analyzes the extent to which these decoupling capacitors are also suitable as a countermeasure in soft failure issues as result of electrostatic discharge (ESD) events.
Translated title of the contributionInfluence of Decoupling Capacitors on Soft Failures of Integrated Circuits during ESD Events
Original languageGerman (Austria)
Title of host publicationTagungsband ESD Forum 2019
Number of pages7
Publication statusPublished - Oct 2019

Fields of science

  • 102 Computer Sciences
  • 202 Electrical Engineering, Electronics, Information Engineering

JKU Focus areas

  • Digital Transformation

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