Abstract
Decoupling capacitors are appropriate measure in the field of electromagnetic compatibility (EMC) both externally (off-chip) and internally (on-chip) to reduce the electromagnetic emission of an integrated circuit. This article analyzes the extent to which these decoupling capacitors are also suitable as a countermeasure in soft failure issues as result of electrostatic discharge (ESD) events.
Translated title of the contribution | Influence of Decoupling Capacitors on Soft Failures of Integrated Circuits during ESD Events |
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Original language | German (Austria) |
Title of host publication | Tagungsband ESD Forum 2019 |
Number of pages | 7 |
Publication status | Published - Oct 2019 |
Fields of science
- 102 Computer Sciences
- 202 Electrical Engineering, Electronics, Information Engineering
JKU Focus areas
- Digital Transformation