TY - GEN
T1 - Efficient Cross-Level Testing for Processor Verification: A RISC-V Case-Study
AU - Herdt, Vladimir
AU - Große, Daniel
AU - Eyck, Jentzsch
AU - Drechsler, Rolf
PY - 2020/9/15
Y1 - 2020/9/15
N2 - Extensive processor verification at the RegisterTransfer Level (RTL) is crucial to avoid bugs. Therefore, simulation-based approaches are prevalent but they require efficient test generation methods to achieve a thorough verification. In this paper we propose an efficient cross-level testing approach for processor verification targeting the RISC-V Instruction Set Architecture (ISA). We generate an endless instruction stream without restrictions on the generated instructions by evolving the instruction stream on-the-fly during simulation. An Instruction Set Simulator (ISS) is leveraged as reference model for the RTL core under test in a tightly coupled crosslevel co-simulation setting. This enables a very efficient and comprehensive testing process. As a case-study we present results on the verification of the 32 bit pipelined RISC-V core of MINRES The Good Folk (TGF) Series Our approach has been very effective in finding several serious bugs.
AB - Extensive processor verification at the RegisterTransfer Level (RTL) is crucial to avoid bugs. Therefore, simulation-based approaches are prevalent but they require efficient test generation methods to achieve a thorough verification. In this paper we propose an efficient cross-level testing approach for processor verification targeting the RISC-V Instruction Set Architecture (ISA). We generate an endless instruction stream without restrictions on the generated instructions by evolving the instruction stream on-the-fly during simulation. An Instruction Set Simulator (ISS) is leveraged as reference model for the RTL core under test in a tightly coupled crosslevel co-simulation setting. This enables a very efficient and comprehensive testing process. As a case-study we present results on the verification of the 32 bit pipelined RISC-V core of MINRES The Good Folk (TGF) Series Our approach has been very effective in finding several serious bugs.
UR - https://www.scopus.com/pages/publications/85096148698
U2 - 10.1109/FDL50818.2020.9232941
DO - 10.1109/FDL50818.2020.9232941
M3 - Conference proceedings
T3 - Forum on Specification and Design Languages
BT - Forum on specification and Design Languages (FDL)
ER -