Do you smell it too? Towards Bad Smells in IEC 61499 Applications

Lisa Sonnleithner; Sandor Bacsi; Michael Oberlehner; Elene Kutsia; Alois Zoitl

doi:10.1109/ETFA45728.2021.9613379

Do you smell it too? Towards Bad Smells in IEC 61499 Applications

LIT Cyber-Physical Systems Lab

Research output: Chapter in Book/Report/Conference proceeding › Conference proceedings › peer-review

Abstract

Bad Smells are certain suboptimal structures or patterns in software. They can cause maintenance issues and hinder understandability. Therefore, it is essential to avoid Bad Smells in software. While the topic is well researched in other fields, it is still an open issue in industrial automation. In this work, we are taking a step towards closing that gap and propose a catalog of IEC 61499 Bad Smells.

Original language	English
Title of host publication	Proceedings - 2021 26th IEEE International Conference on Emerging Technologies and Factory Automation, ETFA 2021
Place of Publication	New York, USA
Publisher	IEEE
Pages	1-4
Number of pages	4
ISBN (Electronic)	9781728129891
ISBN (Print)	978-1-7281-2989-1
DOIs	https://doi.org/10.1109/ETFA45728.2021.9613379
Publication status	Published - Dec 2021

Publication series

Name	IEEE International Conference on Emerging Technologies and Factory Automation, ETFA
Volume	2021-September
ISSN (Print)	1946-0740
ISSN (Electronic)	1946-0759

Fields of science

202017 Embedded systems
102022 Software development
102025 Distributed systems
102029 Practical computer science
202003 Automation
202041 Computer engineering

JKU Focus areas

Digital Transformation

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

Access to Document

10.1109/ETFA45728.2021.9613379

Cite this

Sonnleithner, L., Bacsi, S., Oberlehner, M., Kutsia, E., & Zoitl, A. (2021). Do you smell it too? Towards Bad Smells in IEC 61499 Applications. In Proceedings - 2021 26th IEEE International Conference on Emerging Technologies and Factory Automation, ETFA 2021 (pp. 1-4). (IEEE International Conference on Emerging Technologies and Factory Automation, ETFA; Vol. 2021-September). IEEE. https://doi.org/10.1109/ETFA45728.2021.9613379

Sonnleithner, Lisa ; Bacsi, Sandor ; Oberlehner, Michael et al. / Do you smell it too? Towards Bad Smells in IEC 61499 Applications. Proceedings - 2021 26th IEEE International Conference on Emerging Technologies and Factory Automation, ETFA 2021. New York, USA : IEEE, 2021. pp. 1-4 (IEEE International Conference on Emerging Technologies and Factory Automation, ETFA).

@inproceedings{a2c59ea79c894b7d87eea29a67d6c6c1,

title = "Do you smell it too? Towards Bad Smells in IEC 61499 Applications",

abstract = "Bad Smells are certain suboptimal structures or patterns in software. They can cause maintenance issues and hinder understandability. Therefore, it is essential to avoid Bad Smells in software. While the topic is well researched in other fields, it is still an open issue in industrial automation. In this work, we are taking a step towards closing that gap and propose a catalog of IEC 61499 Bad Smells.",

keywords = "Anti-pattern, Bad smell, Code smell, CPPS, CPS, Design smell, Distributed control system, IEC 61499, OCL",

author = "Lisa Sonnleithner and Sandor Bacsi and Michael Oberlehner and Elene Kutsia and Alois Zoitl",

note = "Publisher Copyright: {\textcopyright} 2021 IEEE.",

year = "2021",

month = dec,

doi = "10.1109/ETFA45728.2021.9613379",

language = "English",

isbn = "978-1-7281-2989-1",

series = "IEEE International Conference on Emerging Technologies and Factory Automation, ETFA",

publisher = "IEEE",

pages = "1--4",

booktitle = "Proceedings - 2021 26th IEEE International Conference on Emerging Technologies and Factory Automation, ETFA 2021",

}

Sonnleithner, L, Bacsi, S, Oberlehner, M , Kutsia, E & Zoitl, A 2021, Do you smell it too? Towards Bad Smells in IEC 61499 Applications. in Proceedings - 2021 26th IEEE International Conference on Emerging Technologies and Factory Automation, ETFA 2021. IEEE International Conference on Emerging Technologies and Factory Automation, ETFA, vol. 2021-September, IEEE, New York, USA, pp. 1-4. https://doi.org/10.1109/ETFA45728.2021.9613379

Do you smell it too? Towards Bad Smells in IEC 61499 Applications. / Sonnleithner, Lisa; Bacsi, Sandor; Oberlehner, Michael et al.
Proceedings - 2021 26th IEEE International Conference on Emerging Technologies and Factory Automation, ETFA 2021. New York, USA: IEEE, 2021. p. 1-4 (IEEE International Conference on Emerging Technologies and Factory Automation, ETFA; Vol. 2021-September).

Research output: Chapter in Book/Report/Conference proceeding › Conference proceedings › peer-review

TY - GEN

T1 - Do you smell it too? Towards Bad Smells in IEC 61499 Applications

AU - Sonnleithner, Lisa

AU - Bacsi, Sandor

AU - Oberlehner, Michael

AU - Kutsia, Elene

AU - Zoitl, Alois

PY - 2021/12

Y1 - 2021/12

N2 - Bad Smells are certain suboptimal structures or patterns in software. They can cause maintenance issues and hinder understandability. Therefore, it is essential to avoid Bad Smells in software. While the topic is well researched in other fields, it is still an open issue in industrial automation. In this work, we are taking a step towards closing that gap and propose a catalog of IEC 61499 Bad Smells.

AB - Bad Smells are certain suboptimal structures or patterns in software. They can cause maintenance issues and hinder understandability. Therefore, it is essential to avoid Bad Smells in software. While the topic is well researched in other fields, it is still an open issue in industrial automation. In this work, we are taking a step towards closing that gap and propose a catalog of IEC 61499 Bad Smells.

KW - Anti-pattern

KW - Bad smell

KW - Code smell

KW - CPPS

KW - CPS

KW - Design smell

KW - Distributed control system

KW - IEC 61499

KW - OCL

UR - https://www.scopus.com/pages/publications/85122952884

U2 - 10.1109/ETFA45728.2021.9613379

DO - 10.1109/ETFA45728.2021.9613379

M3 - Conference proceedings

SN - 978-1-7281-2989-1

T3 - IEEE International Conference on Emerging Technologies and Factory Automation, ETFA

SP - 1

EP - 4

BT - Proceedings - 2021 26th IEEE International Conference on Emerging Technologies and Factory Automation, ETFA 2021

PB - IEEE

CY - New York, USA

ER -

Sonnleithner L, Bacsi S, Oberlehner M , Kutsia E , Zoitl A. Do you smell it too? Towards Bad Smells in IEC 61499 Applications. In Proceedings - 2021 26th IEEE International Conference on Emerging Technologies and Factory Automation, ETFA 2021. New York, USA: IEEE. 2021. p. 1-4. (IEEE International Conference on Emerging Technologies and Factory Automation, ETFA). doi: 10.1109/ETFA45728.2021.9613379

Do you smell it too? Towards Bad Smells in IEC 61499 Applications

Abstract

Publication series

Fields of science

JKU Focus areas

UN SDGs

Access to Document

Other files and links

Christian Doppler Laboratory for Mastering Variability in Software-intensive Cyber-physical Production Systems (CDL VaSiCS)

Cite this

Do you smell it too? Towards Bad Smells in IEC 61499 Applications

Abstract

Publication series

Fields of science

JKU Focus areas

UN SDGs

Access to Document

Other files and links

Projects

Christian Doppler Laboratory for Mastering Variability in Software-intensive Cyber-physical Production Systems (CDL VaSiCS)

Cite this