Direct determination of strain and composition profiles in SiGe islands by anomalous x-ray diffraction at high momentum transfer

Tobias Schülli, Julian Stangl, Zhenyang Zhong, Till Hartmut Metzger, Michael Sztucki, Günther Bauer, Rainer T. Lechner

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Article number066105
Number of pages4
JournalPhysical Review Letters
Volume90
Issue number6
DOIs
Publication statusPublished - 2003

Fields of science

  • 103 Physics, Astronomy
  • 103009 Solid state physics
  • 103011 Semiconductor physics
  • 103017 Magnetism
  • 103018 Materials physics
  • 103040 Photonics
  • 202032 Photovoltaics
  • 210006 Nanotechnology

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