Diffuse x-ray scattering from graded SiGe/Si layers

S. Danis; Vaclav Holy; Julian Stangl; Günther Bauer

doi:10.1209/0295-5075/82/66004

Diffuse x-ray scattering from graded SiGe/Si layers

S. Danis
, Vaclav Holy
, Julian Stangl
, Günther Bauer

Research output: Contribution to journal › Article › peer-review

Original language	English
Article number	66004
Pages (from-to)	66004/p1-p5
Number of pages	5
Journal	Europhysics Letters
Volume	82
Issue number	6
DOIs	https://doi.org/10.1209/0295-5075/82/66004
Publication status	Published - 01 Jun 2008

Fields of science

103 Physics, Astronomy
103009 Solid state physics
103011 Semiconductor physics
103017 Magnetism
103018 Materials physics
103040 Photonics
202032 Photovoltaics
210006 Nanotechnology

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title = "Diffuse x-ray scattering from graded SiGe/Si layers",

author = "S. Danis and Vaclav Holy and Julian Stangl and G{\"u}nther Bauer",

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T1 - Diffuse x-ray scattering from graded SiGe/Si layers

AU - Danis, S.

AU - Holy, Vaclav

AU - Stangl, Julian

AU - Bauer, Günther

PY - 2008/6/1

Y1 - 2008/6/1

UR - https://www.scopus.com/pages/publications/79051469650

U2 - 10.1209/0295-5075/82/66004

DO - 10.1209/0295-5075/82/66004

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JO - Europhysics Letters

JF - Europhysics Letters

IS - 6

M1 - 66004

ER -

Diffuse x-ray scattering from graded SiGe/Si layers

Fields of science

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