Determination of threading dislocation density in hetero-epitaxial layers by diffuse x-ray scattering

  • Günther Bauer
  • , E.A. Fitzgerald
  • , Vaclav Holy
  • , Ewald Koppensteiner
  • , A. Schuh
  • , G.P. Watson

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Pages (from-to)A114-A119
JournalJournal of Physics D: Applied Physics
Volume28
Issue number4
DOIs
Publication statusPublished - 14 Apr 1995

Fields of science

  • 103 Physics, Astronomy
  • 103009 Solid state physics
  • 103011 Semiconductor physics
  • 103017 Magnetism
  • 103018 Materials physics
  • 103040 Photonics
  • 202032 Photovoltaics
  • 210006 Nanotechnology

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