Determination of Diffusion Lengths of Minority Carriers in Hg1-xCdxTe by EBIC Method

J. Franc, E. Belas, R. Grill, A. Toth, Helmut Sitter, P. Moravec, P. Höschl

Research output: Chapter in Book/Report/Conference proceeding › Conference proceedings

Original language	English
Title of host publication	Proc. SPIE 3182, Material Science and Material Properties for Infrared Optoelectronics
DOIs	https://doi.org/10.1117/12.280429
Publication status	Published - 1997

Fields of science

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title = "Determination of Diffusion Lengths of Minority Carriers in Hg1-xCdxTe by EBIC Method",

author = "J. Franc and E. Belas and R. Grill and A. Toth and Helmut Sitter and P. Moravec and P. H{\"o}schl",

year = "1997",

doi = "10.1117/12.280429",

language = "English",

booktitle = "Proc. SPIE 3182, Material Science and Material Properties for Infrared Optoelectronics",

}

TY - GEN

T1 - Determination of Diffusion Lengths of Minority Carriers in Hg1-xCdxTe by EBIC Method

AU - Franc, J.

AU - Belas, E.

AU - Grill, R.

AU - Toth, A.

AU - Sitter, Helmut

AU - Moravec, P.

AU - Höschl, P.

PY - 1997

Y1 - 1997

U2 - 10.1117/12.280429

DO - 10.1117/12.280429

M3 - Conference proceedings

BT - Proc. SPIE 3182, Material Science and Material Properties for Infrared Optoelectronics

ER -