Determination of diffusion lengths of minority carriers in Cd
            1-xZn
            xTe (x ≈ 0.04) by the EBIC method

J. Franc; E. Belas; A. L. Toth; Yu. M. Ivanov; Helmut Sitter; P. Moravec; P. Höschl

doi:10.1088/0268-1242/13/3/011

Determination of diffusion lengths of minority carriers in Cd _1-xZn _xTe (x ≈ 0.04) by the EBIC method

J. Franc
, E. Belas
, A. L. Toth
, Yu. M. Ivanov
, Helmut Sitter
, P. Moravec
, P. Höschl

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	314-317
Number of pages	4
Journal	Semiconductor Science and Technology
Volume	13
Issue number	3
DOIs	https://doi.org/10.1088/0268-1242/13/3/011
Publication status	Published - Mar 1998

Fields of science

103 Physics, Astronomy
103009 Solid state physics
103011 Semiconductor physics
103017 Magnetism
103018 Materials physics
210006 Nanotechnology
103040 Photonics
202032 Photovoltaics

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10.1088/0268-1242/13/3/011

Cite this

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title = "Determination of diffusion lengths of minority carriers in Cd 1-xZn xTe (x ≈ 0.04) by the EBIC method",

author = "J. Franc and E. Belas and Toth, \{A. L.\} and Ivanov, \{Yu. M.\} and Helmut Sitter and P. Moravec and P. H{\"o}schl",

year = "1998",

month = mar,

doi = "10.1088/0268-1242/13/3/011",

language = "English",

volume = "13",

pages = "314--317",

journal = "Semiconductor Science and Technology",

publisher = "IOP Publishing",

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TY - JOUR

T1 - Determination of diffusion lengths of minority carriers in Cd 1-xZn xTe (x ≈ 0.04) by the EBIC method

AU - Franc, J.

AU - Belas, E.

AU - Toth, A. L.

AU - Ivanov, Yu. M.

AU - Sitter, Helmut

AU - Moravec, P.

AU - Höschl, P.

PY - 1998/3

Y1 - 1998/3

UR - https://www.scopus.com/pages/publications/0007761603

U2 - 10.1088/0268-1242/13/3/011

DO - 10.1088/0268-1242/13/3/011

M3 - Article

VL - 13

SP - 314

EP - 317

JO - Semiconductor Science and Technology

JF - Semiconductor Science and Technology

IS - 3

ER -

Determination of diffusion lengths of minority carriers in Cd 1-xZn xTe (x ≈ 0.04) by the EBIC method

Fields of science

Access to Document

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Determination of diffusion lengths of minority carriers in Cd _1-xZn _xTe (x ≈ 0.04) by the EBIC method