Abstract
Polarization induced degenerate n-type doping with electron concentrations up to ∼1020 cm−3 is achieved in graded AlxGa1−xN layers (x: 0% → 37%) grown on unintentionally doped and on n-doped GaN:Si buffer/reservoir layers by metal organic vapor phase epitaxy. High resolution x-ray diffraction, transmission electron microscopy, and electron dispersive x-ray spectroscopy confirm the gradient in the composition of the AlxGa1−xN layers, while Hall effect studies reveal the formation of a three dimensional electron slab, whose conductivity can be adjusted through the GaN(:Si) buffer/reservoir.
| Original language | English |
|---|---|
| Article number | 022105 |
| Pages (from-to) | 022105 |
| Number of pages | 4 |
| Journal | Applied Physics Letters |
| Volume | 108 |
| Issue number | 2 |
| DOIs | |
| Publication status | Published - 2016 |
Fields of science
- 210006 Nanotechnology
- 103011 Semiconductor physics
- 103018 Materials physics
- 103009 Solid state physics
- 103017 Magnetism
JKU Focus areas
- Engineering and Natural Sciences (in general)