@article{3cfa7a377e674316a6e8a9edf508f9cb,
title = "Combining four-crystal-seven-reflection and three-crystal-five-reflection diffractometry for the characterization of ZnSe layers grown on GaAs by MOVPE",
author = "M. Heuken and Ewald Koppensteiner and T.W. Ryan and J. S{\"o}llner",
year = "1993",
month = apr,
day = "14",
doi = "10.1088/0022-3727/26/4A/008",
language = "English",
volume = "26",
pages = "A35--A40",
journal = "Journal of Physics D: Applied Physics",
issn = "0022-3727",
publisher = "IOP Publishing Ltd, UK",
number = "4",
}