Clone Detection in IEC 61499 using Metainformation

Elene Kutsia; Lisa Sonnleithner; Rick Rabiser; Alois Zoitl

doi:10.1109/ETFA54631.2023.10275611

Clone Detection in IEC 61499 using Metainformation

Elene Kutsia, Lisa Sonnleithner, Rick Rabiser, Alois Zoitl

LIT Cyber-Physical Systems Lab

Research output: Chapter in Book/Report/Conference proceeding › Conference proceedings › peer-review

Abstract

Analyzing and maintaining the quality of control software is pivotal in the plant manufacturing industry. During software development, certain negative patterns frequently occur. These negative patterns are called code smells and are characterized by code that is hard to understand, maintain or expand. One such smell is duplicated code, also known as clones. Clones often result from clone-and-own reuse, which is common in practice. Detecting clones is crucial to avoid bug propagation and keep maintenance efforts low. This work deals with detecting clones in control software written in the domain-specific modeling language IEC 61499.

Original language	English
Title of host publication	Proceedings of the 28th IEEE IES International Conference on Emerging Technologies and Factory Automation (ETFA 2023)
Place of Publication	New York, NY, United States
Publisher	IEEE
Pages	1-4
Number of pages	4
ISBN (Electronic)	9798350339918
ISBN (Print)	979-8-3503-3991-8
DOIs	https://doi.org/10.1109/ETFA54631.2023.10275611
Publication status	Published - Oct 2023

Publication series

Name	IEEE International Conference on Emerging Technologies and Factory Automation, ETFA
Volume	2023-September
ISSN (Print)	1946-0740
ISSN (Electronic)	1946-0759

Fields of science

202017 Embedded systems
102022 Software development
102025 Distributed systems
102029 Practical computer science
202003 Automation
202041 Computer engineering

JKU Focus areas

Digital Transformation

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

Access to Document

10.1109/ETFA54631.2023.10275611

Cite this

Kutsia, E., Sonnleithner, L., Rabiser, R., & Zoitl, A. (2023). Clone Detection in IEC 61499 using Metainformation. In Proceedings of the 28th IEEE IES International Conference on Emerging Technologies and Factory Automation (ETFA 2023) (pp. 1-4). (IEEE International Conference on Emerging Technologies and Factory Automation, ETFA; Vol. 2023-September). IEEE. https://doi.org/10.1109/ETFA54631.2023.10275611

@inproceedings{a85d48fc8ab4444397375d0307a71451,

title = "Clone Detection in IEC 61499 using Metainformation",

abstract = "Analyzing and maintaining the quality of control software is pivotal in the plant manufacturing industry. During software development, certain negative patterns frequently occur. These negative patterns are called code smells and are characterized by code that is hard to understand, maintain or expand. One such smell is duplicated code, also known as clones. Clones often result from clone-and-own reuse, which is common in practice. Detecting clones is crucial to avoid bug propagation and keep maintenance efforts low. This work deals with detecting clones in control software written in the domain-specific modeling language IEC 61499.",

keywords = "clone detection, code smell, control software, duplicated code, IEC 61499",

author = "Elene Kutsia and Lisa Sonnleithner and Rick Rabiser and Alois Zoitl",

note = "Publisher Copyright: {\textcopyright} 2023 IEEE.",

year = "2023",

month = oct,

doi = "10.1109/ETFA54631.2023.10275611",

language = "English",

isbn = "979-8-3503-3991-8",

series = "IEEE International Conference on Emerging Technologies and Factory Automation, ETFA",

publisher = "IEEE",

pages = "1--4",

booktitle = "Proceedings of the 28th IEEE IES International Conference on Emerging Technologies and Factory Automation (ETFA 2023)",

}

Kutsia, E , Sonnleithner, L , Rabiser, R & Zoitl, A 2023, Clone Detection in IEC 61499 using Metainformation. in Proceedings of the 28th IEEE IES International Conference on Emerging Technologies and Factory Automation (ETFA 2023). IEEE International Conference on Emerging Technologies and Factory Automation, ETFA, vol. 2023-September, IEEE, New York, NY, United States, pp. 1-4. https://doi.org/10.1109/ETFA54631.2023.10275611

Clone Detection in IEC 61499 using Metainformation. / Kutsia, Elene ; Sonnleithner, Lisa ; Rabiser, Rick et al.
Proceedings of the 28th IEEE IES International Conference on Emerging Technologies and Factory Automation (ETFA 2023). New York, NY, United States: IEEE, 2023. p. 1-4 (IEEE International Conference on Emerging Technologies and Factory Automation, ETFA; Vol. 2023-September).

Research output: Chapter in Book/Report/Conference proceeding › Conference proceedings › peer-review

TY - GEN

T1 - Clone Detection in IEC 61499 using Metainformation

AU - Kutsia, Elene

AU - Sonnleithner, Lisa

AU - Rabiser, Rick

AU - Zoitl, Alois

PY - 2023/10

Y1 - 2023/10

N2 - Analyzing and maintaining the quality of control software is pivotal in the plant manufacturing industry. During software development, certain negative patterns frequently occur. These negative patterns are called code smells and are characterized by code that is hard to understand, maintain or expand. One such smell is duplicated code, also known as clones. Clones often result from clone-and-own reuse, which is common in practice. Detecting clones is crucial to avoid bug propagation and keep maintenance efforts low. This work deals with detecting clones in control software written in the domain-specific modeling language IEC 61499.

AB - Analyzing and maintaining the quality of control software is pivotal in the plant manufacturing industry. During software development, certain negative patterns frequently occur. These negative patterns are called code smells and are characterized by code that is hard to understand, maintain or expand. One such smell is duplicated code, also known as clones. Clones often result from clone-and-own reuse, which is common in practice. Detecting clones is crucial to avoid bug propagation and keep maintenance efforts low. This work deals with detecting clones in control software written in the domain-specific modeling language IEC 61499.

KW - clone detection

KW - code smell

KW - control software

KW - duplicated code

KW - IEC 61499

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U2 - 10.1109/ETFA54631.2023.10275611

DO - 10.1109/ETFA54631.2023.10275611

M3 - Conference proceedings

SN - 979-8-3503-3991-8

T3 - IEEE International Conference on Emerging Technologies and Factory Automation, ETFA

SP - 1

EP - 4

BT - Proceedings of the 28th IEEE IES International Conference on Emerging Technologies and Factory Automation (ETFA 2023)

PB - IEEE

CY - New York, NY, United States

ER -

Kutsia E , Sonnleithner L , Rabiser R , Zoitl A. Clone Detection in IEC 61499 using Metainformation. In Proceedings of the 28th IEEE IES International Conference on Emerging Technologies and Factory Automation (ETFA 2023). New York, NY, United States: IEEE. 2023. p. 1-4. (IEEE International Conference on Emerging Technologies and Factory Automation, ETFA). doi: 10.1109/ETFA54631.2023.10275611

Clone Detection in IEC 61499 using Metainformation

Abstract

Publication series

Fields of science

JKU Focus areas

UN SDGs

Access to Document

Other files and links

Christian Doppler Laboratory for Mastering Variability in Software-intensive Cyber-physical Production Systems (CDL VaSiCS)

Cite this

Clone Detection in IEC 61499 using Metainformation

Abstract

Publication series

Fields of science

JKU Focus areas

UN SDGs

Access to Document

Other files and links

Projects

Christian Doppler Laboratory for Mastering Variability in Software-intensive Cyber-physical Production Systems (CDL VaSiCS)

Cite this