Characterization of ultrathin Cr layers on PET by RBS and XRF

Markus Draxler; S. Zoister; Friedrich Kastner; Martin Bergsmann; Peter Bauer

doi:10.1002/sia.1406

Characterization of ultrathin Cr layers on PET by RBS and XRF

Markus Draxler
, S. Zoister
, Friedrich Kastner
, Martin Bergsmann
, Peter Bauer

Department of Surface Physics

Research output: Contribution to journal › Conference article › peer-review

Original language	English
Pages (from-to)	763-766
Number of pages	4
Journal	Surface and Interface Analysis
Volume	34
Issue number	1
DOIs	https://doi.org/10.1002/sia.1406
Publication status	Published - Aug 2002

Fields of science

103 Physics, Astronomy
103008 Experimental physics
103020 Surface physics

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10.1002/sia.1406

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title = "Characterization of ultrathin Cr layers on PET by RBS and XRF",

author = "Markus Draxler and S. Zoister and Friedrich Kastner and Martin Bergsmann and Peter Bauer",

year = "2002",

month = aug,

doi = "10.1002/sia.1406",

language = "English",

volume = "34",

pages = "763--766",

journal = "Surface and Interface Analysis",

issn = "1096-9918",

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number = "1",

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T1 - Characterization of ultrathin Cr layers on PET by RBS and XRF

AU - Draxler, Markus

AU - Zoister, S.

AU - Kastner, Friedrich

AU - Bergsmann, Martin

AU - Bauer, Peter

PY - 2002/8

Y1 - 2002/8

UR - https://www.scopus.com/pages/publications/0036693510

U2 - 10.1002/sia.1406

DO - 10.1002/sia.1406

M3 - Conference article

SN - 1096-9918

VL - 34

SP - 763

EP - 766

JO - Surface and Interface Analysis

JF - Surface and Interface Analysis

IS - 1

ER -

Characterization of ultrathin Cr layers on PET by RBS and XRF

Fields of science

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