Characterization of semiconductor surfaces and interfaces by x-ray reflectivity measurements

Werner Ahrer, N. Frank, Vaclav Holy, W.V.D. Hoogenhof, K. Lischka, W. Plotz, C. Schiller

Research output: Contribution to journal › Article › peer-review

Original language	English
Journal	Materials Science Forum
DOIs	https://doi.org/10.4028/www.scientific.net/msf.143-147.561
Publication status	Published - 1994

Fields of science

@article{67d2f694cb334ae38ffa595b2b7fb392,

title = "Characterization of semiconductor surfaces and interfaces by x-ray reflectivity measurements",

author = "Werner Ahrer and N. Frank and Vaclav Holy and W.V.D. Hoogenhof and K. Lischka and W. Plotz and C. Schiller",

year = "1994",

doi = "10.4028/www.scientific.net/msf.143-147.561",

language = "English",

journal = "Materials Science Forum",

issn = "0255-5476",

publisher = "Trans Tech Publications Ltd, Switzerland",

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TY - JOUR

T1 - Characterization of semiconductor surfaces and interfaces by x-ray reflectivity measurements

AU - Ahrer, Werner

AU - Frank, N.

AU - Holy, Vaclav

AU - Hoogenhof, W.V.D.

AU - Lischka, K.

AU - Plotz, W.

AU - Schiller, C.

PY - 1994

Y1 - 1994

U2 - 10.4028/www.scientific.net/msf.143-147.561

DO - 10.4028/www.scientific.net/msf.143-147.561

M3 - Article

SN - 0255-5476

JO - Materials Science Forum

JF - Materials Science Forum

ER -