Characterization of LTCC Substrates up to 100 GHz

Sulav Adhikari; Andreas Stelzer; Andreas Springer; Christoph Wagner; Christian Korden; Manfred Stadler

doi:10.1109/ICMMT.2008.4540821

Characterization of LTCC Substrates up to 100 GHz

Sulav Adhikari
, Andreas Stelzer
, Andreas Springer
, Christoph Wagner
, Christian Korden
, Manfred Stadler

Institute for Communications Engineering and RF-Systems

Research output: Chapter in Book/Report/Conference proceeding › Conference proceedings › peer-review

Abstract

This paper deals with the characterization of LTCC substrates up to 100 GHz. Planar transmission lines and resonators are used for characterizing the substrates. Measurement results for the relative permittivity obtained from the investigated structures are presented.

Original language	English
Title of host publication	ICMMT 2008
Pages	1776-1779
Number of pages	4
Volume	4
DOIs	https://doi.org/10.1109/ICMMT.2008.4540821
Publication status	Published - Apr 2008

Publication series

Name	Proceedings of the International Conference on Microwave and Millimeter Wave Technology 2008

Fields of science

202028 Microelectronics

Access to Document

10.1109/ICMMT.2008.4540821

Cite this

@inproceedings{b1088b926da34c1891ce0c1d755e3893,

title = "Characterization of LTCC Substrates up to 100 GHz",

abstract = "This paper deals with the characterization of LTCC substrates up to 100 GHz. Planar transmission lines and resonators are used for characterizing the substrates. Measurement results for the relative permittivity obtained from the investigated structures are presented.",

author = "Sulav Adhikari and Andreas Stelzer and Andreas Springer and Christoph Wagner and Christian Korden and Manfred Stadler",

year = "2008",

month = apr,

doi = "10.1109/ICMMT.2008.4540821",

language = "English",

isbn = "978-1-4244-1879-4",

volume = "4",

series = "Proceedings of the International Conference on Microwave and Millimeter Wave Technology 2008",

pages = "1776--1779",

booktitle = "ICMMT 2008",

}

TY - GEN

T1 - Characterization of LTCC Substrates up to 100 GHz

AU - Adhikari, Sulav

AU - Stelzer, Andreas

AU - Springer, Andreas

AU - Wagner, Christoph

AU - Korden, Christian

AU - Stadler, Manfred

PY - 2008/4

Y1 - 2008/4

N2 - This paper deals with the characterization of LTCC substrates up to 100 GHz. Planar transmission lines and resonators are used for characterizing the substrates. Measurement results for the relative permittivity obtained from the investigated structures are presented.

AB - This paper deals with the characterization of LTCC substrates up to 100 GHz. Planar transmission lines and resonators are used for characterizing the substrates. Measurement results for the relative permittivity obtained from the investigated structures are presented.

UR - http://ieeexplore.ieee.org

U2 - 10.1109/ICMMT.2008.4540821

DO - 10.1109/ICMMT.2008.4540821

M3 - Conference proceedings

SN - 978-1-4244-1879-4

VL - 4

T3 - Proceedings of the International Conference on Microwave and Millimeter Wave Technology 2008

SP - 1776

EP - 1779

BT - ICMMT 2008

ER -

Characterization of LTCC Substrates up to 100 GHz

Abstract

Publication series

Fields of science

Access to Document

Other files and links

Cite this