Characterization of Fe-N nanocrystals and nitrogen-containing inclusions in (Ga,Fe)N thin films using transmission electron microscopy

A. Kovacs, B. Schaffer, M. S. Moreno, J. R. Jinschek, A. J. Craven, T. Dietl, Alberta Bonanni, R. E. Dunin-Borkowksi

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Article number033530
Pages (from-to)033530
Number of pages7
JournalJournal of Applied Physics
Volume114
Issue number3
DOIs
Publication statusPublished - 21 Jul 2013

Fields of science

  • 103009 Solid state physics
  • 103021 Optics
  • 103011 Semiconductor physics
  • 103 Physics, Astronomy

JKU Focus areas

  • Engineering and Natural Sciences (in general)

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