Characterisation of the Radiated Electromagnetic Emission of Clock Trees

Timm Ostermann; Bernd Deutschmann; Christoph Lackner

Characterisation of the Radiated Electromagnetic Emission of Clock Trees

Timm Ostermann, Bernd Deutschmann, Christoph Lackner

Institute of Integrated Circuits

Research output: Chapter in Book/Report/Conference proceeding › Conference proceedings › peer-review

Abstract

The paper describes the characterisation of the radiated electromagnetic emission (EME) caused by different clock trees. Although the output-driver are assumed to be one of the main sources for generation of electromagnetic emission, the clock trees should also be considered as a possible source for EME problems. This paper therefore deals with clock tree measurements and with the investigation how on-chip decoupling capacitors could influence the EME of ICs. The TEM-cell method described in IEC 61967-2 is used for these measurements.

Original language	English
Title of host publication	4rd International Workshop on Electromagnetic Compatibility of Integrated Circuits (EMCCOMPO 2004)
Number of pages	6
Publication status	Published - 2004

Fields of science

102005 Computer aided design (CAD)
202 Electrical Engineering, Electronics, Information Engineering
202006 Computer hardware
202018 Semiconductor electronics
202023 Integrated circuits
202027 Mechatronics
202028 Microelectronics
202037 Signal processing

Cite this

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title = "Characterisation of the Radiated Electromagnetic Emission of Clock Trees",

abstract = "The paper describes the characterisation of the radiated electromagnetic emission (EME) caused by different clock trees. Although the output-driver are assumed to be one of the main sources for generation of electromagnetic emission, the clock trees should also be considered as a possible source for EME problems. This paper therefore deals with clock tree measurements and with the investigation how on-chip decoupling capacitors could influence the EME of ICs. The TEM-cell method described in IEC 61967-2 is used for these measurements.",

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AB - The paper describes the characterisation of the radiated electromagnetic emission (EME) caused by different clock trees. Although the output-driver are assumed to be one of the main sources for generation of electromagnetic emission, the clock trees should also be considered as a possible source for EME problems. This paper therefore deals with clock tree measurements and with the investigation how on-chip decoupling capacitors could influence the EME of ICs. The TEM-cell method described in IEC 61967-2 is used for these measurements.

M3 - Conference proceedings

BT - 4rd International Workshop on Electromagnetic Compatibility of Integrated Circuits (EMCCOMPO 2004)

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