Characterisation of nano-composite M-2411/Y-123 thin films by electron backscatter diffraction and in-field critical current measurements

Marius-Aurel Bodea; Johannes David Pedarnig; T.D. Withnell; Harald W. Weber; D.A. Cardwell; N. Hari Babu; A. Koblischka-Veneva

Characterisation of nano-composite M-2411/Y-123 thin films by electron backscatter diffraction and in-field critical current measurements

Marius-Aurel Bodea, Johannes David Pedarnig, T.D. Withnell, Harald W. Weber, D.A. Cardwell, N. Hari Babu, A. Koblischka-Veneva

Institute of Applied Physics

Research output: Contribution to journal › Article › peer-review

Original language	English
Number of pages	5
Journal	Journal of Physics: Conference Series
Volume	234
Publication status	Published - Jan 2010

Fields of science

103016 Laser physics
210005 Nanophotonics

Cite this

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title = "Characterisation of nano-composite M-2411/Y-123 thin films by electron backscatter diffraction and in-field critical current measurements",

author = "Marius-Aurel Bodea and Pedarnig, \{Johannes David\} and T.D. Withnell and Weber, \{Harald W.\} and D.A. Cardwell and \{Hari Babu\}, N. and A. Koblischka-Veneva",

year = "2010",

month = jan,

language = "English",

volume = "234",

journal = "Journal of Physics: Conference Series",

issn = "1742-6596",

publisher = "IoP",

}

TY - JOUR

T1 - Characterisation of nano-composite M-2411/Y-123 thin films by electron backscatter diffraction and in-field critical current measurements

AU - Bodea, Marius-Aurel

AU - Pedarnig, Johannes David

AU - Withnell, T.D.

AU - Weber, Harald W.

AU - Cardwell, D.A.

AU - Hari Babu, N.

AU - Koblischka-Veneva, A.

PY - 2010/1

Y1 - 2010/1

M3 - Article

SN - 1742-6596

VL - 234

JO - Journal of Physics: Conference Series

JF - Journal of Physics: Conference Series

ER -