Calibration of a Flexible High Precision Power-On Reset during Production Test

Gerald Hilber; Dominik Gruber; Michael Sams; Timm Ostermann

Calibration of a Flexible High Precision Power-On Reset during Production Test

Gerald Hilber
, Dominik Gruber
, Michael Sams
, Timm Ostermann

Institute for Integrated Circuits and Quantum Computing

Research output: Chapter in Book/Report/Conference proceeding › Conference proceedings › peer-review

Abstract

This paper describes a Power-On Reset (POR) circuit with very accurate threshold voltage levels. These voltage levels are achieved by calibrating an on-chip programmable voltage reference during the wafer sort or ﬁnal test. Two different calibration methods are proposed. One which calibrates the reference voltage of a comparator and another method which calibrates the POR threshold voltage levels itself. Not only the variation of the POR threshold voltage levels can be reduced from 90mV to 7mV, but also the absolute value can be changed.

Original language	English
Title of host publication	International Test Conference 2012
Editors	International Test Conference
Number of pages	18
Publication status	Published - Nov 2012

Fields of science

102005 Computer aided design (CAD)
202006 Computer hardware
202018 Semiconductor electronics
202028 Microelectronics
202037 Signal processing

JKU Focus areas

Computation in Informatics and Mathematics
Mechatronics and Information Processing
Nano-, Bio- and Polymer-Systems: From Structure to Function

Cite this

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abstract = "This paper describes a Power-On Reset (POR) circuit with very accurate threshold voltage levels. These voltage levels are achieved by calibrating an on-chip programmable voltage reference during the wafer sort or ﬁnal test. Two different calibration methods are proposed. One which calibrates the reference voltage of a comparator and another method which calibrates the POR threshold voltage levels itself. Not only the variation of the POR threshold voltage levels can be reduced from 90mV to 7mV, but also the absolute value can be changed.",

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AB - This paper describes a Power-On Reset (POR) circuit with very accurate threshold voltage levels. These voltage levels are achieved by calibrating an on-chip programmable voltage reference during the wafer sort or ﬁnal test. Two different calibration methods are proposed. One which calibrates the reference voltage of a comparator and another method which calibrates the POR threshold voltage levels itself. Not only the variation of the POR threshold voltage levels can be reduced from 90mV to 7mV, but also the absolute value can be changed.

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