Calibrated complex impedance and permittivity measurements with scanning microwave microscopy.

Georg Gramse; M. Kasper; L. Fumagalli; Peter Hinterdorfer

doi:10.1088/0957-4484/25/14/145703

Calibrated complex impedance and permittivity measurements with scanning microwave microscopy.

Georg Gramse
, M. Kasper
, L. Fumagalli
, Peter Hinterdorfer

Department of Applied Experimental Biophysics

Research output: Contribution to journal › Article › peer-review

Original language	English
Article number	145703
Number of pages	1
Journal	Nanotechnology
Volume	25
Issue number	14
DOIs	https://doi.org/10.1088/0957-4484/25/14/145703
Publication status	Published - 11 Apr 2014

Fields of science

103 Physics, Astronomy
106006 Biophysics

JKU Focus areas

Engineering and Natural Sciences (in general)

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10.1088/0957-4484/25/14/145703

Cite this

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title = "Calibrated complex impedance and permittivity measurements with scanning microwave microscopy.",

author = "Georg Gramse and M. Kasper and L. Fumagalli and Peter Hinterdorfer",

year = "2014",

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language = "English",

volume = "25",

journal = "Nanotechnology",

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T1 - Calibrated complex impedance and permittivity measurements with scanning microwave microscopy.

AU - Gramse, Georg

AU - Kasper, M.

AU - Fumagalli, L.

AU - Hinterdorfer, Peter

PY - 2014/4/11

Y1 - 2014/4/11

UR - https://www.scopus.com/pages/publications/84896303957

U2 - 10.1088/0957-4484/25/14/145703

DO - 10.1088/0957-4484/25/14/145703

M3 - Article

SN - 0957-4484

VL - 25

JO - Nanotechnology

JF - Nanotechnology

IS - 14

M1 - 145703

ER -

Calibrated complex impedance and permittivity measurements with scanning microwave microscopy.

Fields of science

JKU Focus areas

Access to Document

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