TY - GEN
T1 - Applying a Consistency Checking Framework for Heterogeneous Models and Artifacts in Industrial Product Lines
AU - Vierhauser, Michael
AU - Grünbacher, Paul
AU - Heider, Wolfgang
AU - Holl, Gerald
AU - Lettner, Daniela
PY - 2012
Y1 - 2012
N2 - Product line engineering relies on heterogeneous models and artifacts to define and implement the product line’s reusable assets. The complexity and heterogeneity of product line artifacts as well as their interdependencies make it hard to maintain consistency during development and evolution, regardless of the modeling approaches used. Engineers thus need support for detecting and resolving inconsistencies within and between the various artifacts. In this paper we present a framework for checking and maintaining consistency of arbitrary product line artifacts. Our approach is flexible and extensible regarding the supported artifact types and the definition of constraints. We discuss tool support developed for the DOPLER product line tool suite. We report the results of applying the approach to sales support applications of industrial product lines.
AB - Product line engineering relies on heterogeneous models and artifacts to define and implement the product line’s reusable assets. The complexity and heterogeneity of product line artifacts as well as their interdependencies make it hard to maintain consistency during development and evolution, regardless of the modeling approaches used. Engineers thus need support for detecting and resolving inconsistencies within and between the various artifacts. In this paper we present a framework for checking and maintaining consistency of arbitrary product line artifacts. Our approach is flexible and extensible regarding the supported artifact types and the definition of constraints. We discuss tool support developed for the DOPLER product line tool suite. We report the results of applying the approach to sales support applications of industrial product lines.
UR - https://www.scopus.com/pages/publications/84867650915
U2 - 10.1007/978-3-642-33666-9_34
DO - 10.1007/978-3-642-33666-9_34
M3 - Conference proceedings
SN - 9783642336652
VL - 7590
T3 - Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)
SP - 531
EP - 545
BT - Model Driven Engineering Languages and Systems, 15th International ACM/IEEE Conference on Model Driven Engineering Languages & Systems (MODELS)
PB - Springer
ER -