Analysis of Spurious Emission and In-Band Phase Noise of an All Digital Phase Locked Loop for RF Synthesis using a Frequency Discriminator

Christian Wicpalek, Thomas Mayer, Linus Maurer, Ulrich Vollenbruch, Tindaro Pittorino, Andreas Springer

Research output: Chapter in Book/Report/Conference proceedingConference proceedingspeer-review

Abstract

In almost every wireless RF application, a Phase Locked Loop (PLL) is required. Digital signal processing especially for PLLs in CMOS technology is increasingly used instead of conventional analog processing to improve reliability, to reduce power consumption, and to allow for reconfigurability. This paper presents a simulative analysis of an All Digital PLL (ADPLL) with a two bit Frequency Discriminator (FD) in the feedback path. Effects on the in-band noise performance due to the sampling rate are treated. Furthermore, a theoretical prediction and simulative analysis of spurious emission offset frequencies will be given.
Original languageEnglish
Title of host publicationProc. International Symposium on Circuits and Systems (ISCAS 2007)
Pages3518-3521
Number of pages4
Publication statusPublished - 2007

Fields of science

  • 202 Electrical Engineering, Electronics, Information Engineering
  • 202019 High frequency engineering
  • 202029 Microwave engineering
  • 202030 Communication engineering
  • 202033 Radar technology
  • 202037 Signal processing
  • 202038 Telecommunications

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