Analysis and Measurement of Spurious Emission and Phase Noise Performance of an RF All-Digital Phase Locked Loop using a Frequency Discriminator

Christian Wicpalek; Thomas Mayer; Linus Maurer; Ulrich Vollenbruch; Yue Liu; Andreas Springer

doi:10.1109/MWSYM.2007.380398

Analysis and Measurement of Spurious Emission and Phase Noise Performance of an RF All-Digital Phase Locked Loop using a Frequency Discriminator

Christian Wicpalek
, Thomas Mayer
, Linus Maurer
, Ulrich Vollenbruch
, Yue Liu
, Andreas Springer

Institute for Communications Engineering and RF-Systems

Research output: Chapter in Book/Report/Conference proceeding › Conference proceedings › peer-review

Abstract

A Frequency Discriminator in All-Digital Phase Locked Loops (ADPLLs) for RF-synthesis has to fulfill several tough requirements. The most important requirements are the in-band phase noise performance and knowledge about offset frequencies of the spurious emissions, because the ADPLL should fulfill several wireless communication standard requirements like UMTS and GSM. This paper presents a theoretical derivation, simulative analysis, and measurement results for the in-band phase noise level and the offset frequencies of spurious emissions of an ADPLL with a two-bit Frequency Discriminator implemented in a standard 0.13 μm CMOS technology.

Original language	English
Title of host publication	Proc. International Microwave Symposium (IMS 2007)
Pages	2205-2208
Number of pages	4
DOIs	https://doi.org/10.1109/MWSYM.2007.380398
Publication status	Published - 2007

Publication series

Name	IEEE MTT-S International Microwave Symposium Digest
ISSN (Print)	0149-645X

Fields of science

202 Electrical Engineering, Electronics, Information Engineering
202019 High frequency engineering
202029 Microwave engineering
202030 Communication engineering
202033 Radar technology
202037 Signal processing
202038 Telecommunications

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10.1109/MWSYM.2007.380398

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Wicpalek, C., Mayer, T., Maurer, L., Vollenbruch, U., Liu, Y., & Springer, A. (2007). Analysis and Measurement of Spurious Emission and Phase Noise Performance of an RF All-Digital Phase Locked Loop using a Frequency Discriminator. In Proc. International Microwave Symposium (IMS 2007) (pp. 2205-2208). Article 4264310 (IEEE MTT-S International Microwave Symposium Digest). https://doi.org/10.1109/MWSYM.2007.380398

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title = "Analysis and Measurement of Spurious Emission and Phase Noise Performance of an RF All-Digital Phase Locked Loop using a Frequency Discriminator",

abstract = "A Frequency Discriminator in All-Digital Phase Locked Loops (ADPLLs) for RF-synthesis has to fulfill several tough requirements. The most important requirements are the in-band phase noise performance and knowledge about offset frequencies of the spurious emissions, because the ADPLL should fulfill several wireless communication standard requirements like UMTS and GSM. This paper presents a theoretical derivation, simulative analysis, and measurement results for the in-band phase noise level and the offset frequencies of spurious emissions of an ADPLL with a two-bit Frequency Discriminator implemented in a standard 0.13 μm CMOS technology.",

author = "Christian Wicpalek and Thomas Mayer and Linus Maurer and Ulrich Vollenbruch and Yue Liu and Andreas Springer",

year = "2007",

doi = "10.1109/MWSYM.2007.380398",

language = "English",

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series = "IEEE MTT-S International Microwave Symposium Digest",

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Wicpalek, C, Mayer, T, Maurer, L, Vollenbruch, U, Liu, Y & Springer, A 2007, Analysis and Measurement of Spurious Emission and Phase Noise Performance of an RF All-Digital Phase Locked Loop using a Frequency Discriminator. in Proc. International Microwave Symposium (IMS 2007)., 4264310, IEEE MTT-S International Microwave Symposium Digest, pp. 2205-2208. https://doi.org/10.1109/MWSYM.2007.380398

Analysis and Measurement of Spurious Emission and Phase Noise Performance of an RF All-Digital Phase Locked Loop using a Frequency Discriminator. / Wicpalek, Christian; Mayer, Thomas; Maurer, Linus et al.
Proc. International Microwave Symposium (IMS 2007). 2007. p. 2205-2208 4264310 (IEEE MTT-S International Microwave Symposium Digest).

Research output: Chapter in Book/Report/Conference proceeding › Conference proceedings › peer-review

TY - GEN

T1 - Analysis and Measurement of Spurious Emission and Phase Noise Performance of an RF All-Digital Phase Locked Loop using a Frequency Discriminator

AU - Wicpalek, Christian

AU - Mayer, Thomas

AU - Maurer, Linus

AU - Vollenbruch, Ulrich

AU - Liu, Yue

AU - Springer, Andreas

PY - 2007

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N2 - A Frequency Discriminator in All-Digital Phase Locked Loops (ADPLLs) for RF-synthesis has to fulfill several tough requirements. The most important requirements are the in-band phase noise performance and knowledge about offset frequencies of the spurious emissions, because the ADPLL should fulfill several wireless communication standard requirements like UMTS and GSM. This paper presents a theoretical derivation, simulative analysis, and measurement results for the in-band phase noise level and the offset frequencies of spurious emissions of an ADPLL with a two-bit Frequency Discriminator implemented in a standard 0.13 μm CMOS technology.

AB - A Frequency Discriminator in All-Digital Phase Locked Loops (ADPLLs) for RF-synthesis has to fulfill several tough requirements. The most important requirements are the in-band phase noise performance and knowledge about offset frequencies of the spurious emissions, because the ADPLL should fulfill several wireless communication standard requirements like UMTS and GSM. This paper presents a theoretical derivation, simulative analysis, and measurement results for the in-band phase noise level and the offset frequencies of spurious emissions of an ADPLL with a two-bit Frequency Discriminator implemented in a standard 0.13 μm CMOS technology.

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DO - 10.1109/MWSYM.2007.380398

M3 - Conference proceedings

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SN - 9781424406883

T3 - IEEE MTT-S International Microwave Symposium Digest

SP - 2205

EP - 2208

BT - Proc. International Microwave Symposium (IMS 2007)

ER -

Wicpalek C, Mayer T, Maurer L, Vollenbruch U, Liu Y, Springer A. Analysis and Measurement of Spurious Emission and Phase Noise Performance of an RF All-Digital Phase Locked Loop using a Frequency Discriminator. In Proc. International Microwave Symposium (IMS 2007). 2007. p. 2205-2208. 4264310. (IEEE MTT-S International Microwave Symposium Digest). doi: 10.1109/MWSYM.2007.380398

Analysis and Measurement of Spurious Emission and Phase Noise Performance of an RF All-Digital Phase Locked Loop using a Frequency Discriminator

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