An investigation of x-ray reflectivity and -diffraction from electroluminescent short period Si-Ge superlattice structures

  • Günther Bauer
  • , H. Kibbel
  • , Ewald Koppensteiner
  • , K. Lischka
  • , W. Plotz
  • , H. Presting

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Article number009
Pages (from-to)1614-1620
Number of pages7
JournalSemiconductor Science and Technology
Volume10
Issue number12
DOIs
Publication statusPublished - 1995

Fields of science

  • 103 Physics, Astronomy
  • 103009 Solid state physics
  • 103011 Semiconductor physics
  • 103017 Magnetism
  • 103018 Materials physics
  • 103040 Photonics
  • 202032 Photovoltaics
  • 210006 Nanotechnology

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