An advanced impedance calibration method for nanoscale microwave imaging

Research output: Chapter in Book/Report/Conference proceeding › Conference proceedings › peer-review

Original language	English
Title of host publication	Microwave Symposium (IMS), 2016 IEEE MTT-S International
Publisher	IEEE
Number of pages	4
ISBN (Electronic)	9781509006984
DOIs	https://doi.org/10.1109/MWSYM.2016.7540183
Publication status	Published - May 2016

Name	IEEE Xplore

Fields of science

@inproceedings{68f433f1163c43ce8571c9771c260931,

title = "An advanced impedance calibration method for nanoscale microwave imaging",

author = "Manuel Kasper and Georg Gramse and Ferry Kienberger",

year = "2016",

month = may,

doi = "10.1109/MWSYM.2016.7540183",

language = "English",

series = "IEEE Xplore",

publisher = "IEEE",

booktitle = "Microwave Symposium (IMS), 2016 IEEE MTT-S International",

}

TY - GEN

T1 - An advanced impedance calibration method for nanoscale microwave imaging

AU - Kasper, Manuel

AU - Gramse, Georg

AU - Kienberger, Ferry

PY - 2016/5

Y1 - 2016/5

UR - https://www.scopus.com/pages/publications/84984940138

U2 - 10.1109/MWSYM.2016.7540183

DO - 10.1109/MWSYM.2016.7540183

M3 - Conference proceedings

T3 - IEEE Xplore

BT - Microwave Symposium (IMS), 2016 IEEE MTT-S International

PB - IEEE

ER -