An advanced impedance calibration method for nanoscale microwave imaging

Manuel Kasper; Georg Gramse; Ferry Kienberger

doi:10.1109/MWSYM.2016.7540183

An advanced impedance calibration method for nanoscale microwave imaging

Manuel Kasper
, Georg Gramse
, Ferry Kienberger

Department of Applied Experimental Biophysics

Research output: Chapter in Book/Report/Conference proceeding › Conference proceedings › peer-review

Original language	English
Title of host publication	Microwave Symposium (IMS), 2016 IEEE MTT-S International
Publisher	IEEE
Number of pages	4
ISBN (Electronic)	9781509006984
DOIs	https://doi.org/10.1109/MWSYM.2016.7540183
Publication status	Published - 09 Aug 2016

Publication series

Name	IEEE MTT-S International Microwave Symposium Digest
Volume	2016-August
ISSN (Print)	0149-645X

Fields of science

103 Physics, Astronomy
106006 Biophysics

JKU Focus areas

Engineering and Natural Sciences (in general)

Access to Document

10.1109/MWSYM.2016.7540183

Cite this

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title = "An advanced impedance calibration method for nanoscale microwave imaging",

author = "Manuel Kasper and Georg Gramse and Ferry Kienberger",

year = "2016",

month = aug,

day = "9",

doi = "10.1109/MWSYM.2016.7540183",

language = "English",

series = "IEEE MTT-S International Microwave Symposium Digest",

publisher = "IEEE",

booktitle = "Microwave Symposium (IMS), 2016 IEEE MTT-S International",

}

An advanced impedance calibration method for nanoscale microwave imaging. / Kasper, Manuel; Gramse, Georg; Kienberger, Ferry.
Microwave Symposium (IMS), 2016 IEEE MTT-S International. IEEE, 2016. 7540183 (IEEE MTT-S International Microwave Symposium Digest; Vol. 2016-August).

Research output: Chapter in Book/Report/Conference proceeding › Conference proceedings › peer-review

TY - GEN

T1 - An advanced impedance calibration method for nanoscale microwave imaging

AU - Kasper, Manuel

AU - Gramse, Georg

AU - Kienberger, Ferry

PY - 2016/8/9

Y1 - 2016/8/9

UR - https://www.scopus.com/pages/publications/84984940138

U2 - 10.1109/MWSYM.2016.7540183

DO - 10.1109/MWSYM.2016.7540183

M3 - Conference proceedings

T3 - IEEE MTT-S International Microwave Symposium Digest

BT - Microwave Symposium (IMS), 2016 IEEE MTT-S International

PB - IEEE

ER -

An advanced impedance calibration method for nanoscale microwave imaging

Publication series

Fields of science

JKU Focus areas

Access to Document

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Cite this