A DaQL to Monitor Data Quality in Machine Learning Applications

Lisa Ehrlinger; Verena Haunschmid; Davide Palazzini; Christian Lettner

doi:10.1007/978-3-030-27615-7_17

A DaQL to Monitor Data Quality in Machine Learning Applications

Lisa Ehrlinger
, Verena Haunschmid
, Davide Palazzini
, Christian Lettner

Institute for Application-oriented Knowledge Processing

Research output: Chapter in Book/Report/Conference proceeding › Conference proceedings › peer-review

Original language	English
Title of host publication	International Conference on Database and Expert Systems Applications (DEXA)
Editors	Sven Hartmann, Josef Küng, Gabriele Anderst-Kotsis, Ismail Khalil, Sharma Chakravarthy, A Min Tjoa
Place of Publication	Cham, Switzerland
Publisher	Springer International Publishing
Pages	227-237
Number of pages	11
Volume	11706
ISBN (Print)	978-3-030-27615-7
DOIs	https://doi.org/10.1007/978-3-030-27615-7_17
Publication status	Published - Aug 2019

Publication series

Name	Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)
Volume	11706 LNCS
ISSN (Print)	0302-9743
ISSN (Electronic)	1611-3349

Fields of science

102001 Artificial intelligence
102010 Database systems
102015 Information systems
102033 Data mining
102035 Data science

JKU Focus areas

Digital Transformation

Access to Document

10.1007/978-3-030-27615-7_17

Cite this

Ehrlinger, L., Haunschmid, V., Palazzini, D., & Lettner, C. (2019). A DaQL to Monitor Data Quality in Machine Learning Applications. In S. Hartmann, J. Küng, G. Anderst-Kotsis, I. Khalil, S. Chakravarthy, & A. M. Tjoa (Eds.), International Conference on Database and Expert Systems Applications (DEXA) (Vol. 11706, pp. 227-237). (Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics); Vol. 11706 LNCS). Springer International Publishing. https://doi.org/10.1007/978-3-030-27615-7_17

Ehrlinger, Lisa ; Haunschmid, Verena ; Palazzini, Davide et al. / A DaQL to Monitor Data Quality in Machine Learning Applications. International Conference on Database and Expert Systems Applications (DEXA). editor / Sven Hartmann ; Josef Küng ; Gabriele Anderst-Kotsis ; Ismail Khalil ; Sharma Chakravarthy ; A Min Tjoa. Vol. 11706 Cham, Switzerland : Springer International Publishing, 2019. pp. 227-237 (Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)).

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title = "A DaQL to Monitor Data Quality in Machine Learning Applications",

author = "Lisa Ehrlinger and Verena Haunschmid and Davide Palazzini and Christian Lettner",

year = "2019",

month = aug,

doi = "10.1007/978-3-030-27615-7\_17",

language = "English",

isbn = "978-3-030-27615-7",

volume = "11706",

series = "Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)",

publisher = "Springer International Publishing",

pages = "227--237",

editor = "Sven Hartmann and Josef K{\"u}ng and Gabriele Anderst-Kotsis and Ismail Khalil and Sharma Chakravarthy and Tjoa, \{A Min\}",

booktitle = "International Conference on Database and Expert Systems Applications (DEXA)",

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Ehrlinger, L, Haunschmid, V, Palazzini, D & Lettner, C 2019, A DaQL to Monitor Data Quality in Machine Learning Applications. in S Hartmann, J Küng, G Anderst-Kotsis, I Khalil, S Chakravarthy & AM Tjoa (eds), International Conference on Database and Expert Systems Applications (DEXA). vol. 11706, Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics), vol. 11706 LNCS, Springer International Publishing, Cham, Switzerland, pp. 227-237. https://doi.org/10.1007/978-3-030-27615-7_17

A DaQL to Monitor Data Quality in Machine Learning Applications. / Ehrlinger, Lisa; Haunschmid, Verena; Palazzini, Davide et al.
International Conference on Database and Expert Systems Applications (DEXA). ed. / Sven Hartmann; Josef Küng; Gabriele Anderst-Kotsis; Ismail Khalil; Sharma Chakravarthy; A Min Tjoa. Vol. 11706 Cham, Switzerland: Springer International Publishing, 2019. p. 227-237 (Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics); Vol. 11706 LNCS).

Research output: Chapter in Book/Report/Conference proceeding › Conference proceedings › peer-review

TY - GEN

T1 - A DaQL to Monitor Data Quality in Machine Learning Applications

AU - Ehrlinger, Lisa

AU - Haunschmid, Verena

AU - Palazzini, Davide

AU - Lettner, Christian

PY - 2019/8

Y1 - 2019/8

UR - https://www.scopus.com/pages/publications/85077136155

U2 - 10.1007/978-3-030-27615-7_17

DO - 10.1007/978-3-030-27615-7_17

M3 - Conference proceedings

SN - 978-3-030-27615-7

VL - 11706

T3 - Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)

SP - 227

EP - 237

BT - International Conference on Database and Expert Systems Applications (DEXA)

A2 - Hartmann, Sven

A2 - Küng, Josef

A2 - Anderst-Kotsis, Gabriele

A2 - Khalil, Ismail

A2 - Chakravarthy, Sharma

A2 - Tjoa, A Min

PB - Springer International Publishing

CY - Cham, Switzerland

ER -

Ehrlinger L, Haunschmid V, Palazzini D, Lettner C. A DaQL to Monitor Data Quality in Machine Learning Applications. In Hartmann S, Küng J, Anderst-Kotsis G, Khalil I, Chakravarthy S, Tjoa AM, editors, International Conference on Database and Expert Systems Applications (DEXA). Vol. 11706. Cham, Switzerland: Springer International Publishing. 2019. p. 227-237. (Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)). doi: 10.1007/978-3-030-27615-7_17

A DaQL to Monitor Data Quality in Machine Learning Applications

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