Daimler Benz - Messungen

Project: Funded researchOther sponsors

Project Details

Description

Measurement of single transistor structures and test circuits to develope a n-typ SiGe modulation doped field effect transistor (MODFET) model for circuit simulation.
StatusFinished
Effective start/end date01.01.199831.01.1998

Collaborative partners

Fields of science

  • 202028 Microelectronics
  • 202023 Integrated circuits
  • 202027 Mechatronics
  • 202018 Semiconductor electronics
  • 202 Electrical Engineering, Electronics, Information Engineering
  • 102005 Computer aided design (CAD)
  • 202037 Signal processing
  • 202006 Computer hardware

JKU Focus areas

  • Digital Transformation