Research output per year
Research output per year
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Electrochemical Scanning Microwave Microscopy Reveals Ion Intercalation Dynamics and Maps Active Sites in 2D Catalyst
Awadein, M., Kumar, A., Wang, Y., Dong, M., Müllegger, S. & Gramse, G., Apr 2025, In: Small. 21, 15, p. e2500043 9 p.Research output: Contribution to journal › Article › peer-review
Open Access -
Microwaves reveal the nanoscale ion intercalation and edge activity of 2D catalyst
Awadein, M., Kumar, A., Wang, Y., Dong, M., Müllegger, S. & Gramse, G., Oct 2024, In: ArXiv. 21 p.Research output: Contribution to journal › Article
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Calibrated microwave reflectance in low-temperature scanning tunneling microscopy
Wit, B., Gramse, G. & Müllegger, S., 01 Oct 2023, In: Review of Scientific Instruments. 94, 10, p. 103702/1-7 7 p., 103702.Research output: Contribution to journal › Article › peer-review
Open Access -
In operando charge transport imaging of atomically thin dopant nanostructures in silicon.
Kölker, A., Gramse, G., Stock, T. J. Z., Aeppli, G. & Curson, N., Apr 2022, In: Nanoscale. 12 p.Research output: Contribution to journal › Article
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Ion-driven nanograin formation in early-stage degradation of tri-cation perovskite films
Richheimer, F., Toth, D., Teklemariam, B., Baker, M. A., Dorey, R. A., Kienberger, F., Castro, F. A., Kaltenbrunner, M., Scharber, M. C., Gramse, G. & Wood, S., 2022, In: Nanoscale. 14, 7, p. 2605 12 p.Research output: Contribution to journal › Article › peer-review
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4DNMR upperVISION2030
Gramse, G. (PI)
06.12.2022 → 31.03.2025
Project: Funded research › Federal / regional / local authorities
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Wideband Electrostatic Force Microscopy (EFM): Broad Frequency Range with High Sensitivity
Gramse, G. (Speaker)
29 Sept 2019Activity: Talk or presentation › Invited talk › science-to-science
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Konferenz
Gramse, G. (Visiting person)
28 Sept 2019 → 30 Sept 2019Activity: Other › Outgoing (legacy data)
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Broadband conductive and dielectric properties by Scanning Microwave and Electrostatic Force Microscopy
Gramse, G. (Speaker)
04 Jul 2019Activity: Talk or presentation › Invited talk › science-to-science
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Konferenz
Gramse, G. (Visiting person)
03 Jul 2019 → 05 Jul 2019Activity: Other › Outgoing (legacy data)
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Dual Bias Modulation Method for Variable Frequency Measurements in Electrostatic Force Microscopy
Gramse, G. (Speaker)
27 May 2019Activity: Talk or presentation › Invited talk › science-to-science