Elene Kutsia

Clone Detection in IEC 61499 using Metainformation

Kutsia, E., Sonnleithner, L., Rabiser, R. & Zoitl, A., Oct 2023, Proceedings of the 28th IEEE IES International Conference on Emerging Technologies and Factory Automation (ETFA 2023). New York, NY, United States: IEEE, p. 1-4 4 p. (IEEE International Conference on Emerging Technologies and Factory Automation, ETFA; vol. 2023-September).

Research output: Chapter in Book/Report/Conference proceeding › Conference proceedings › peer-review

Using Graph Clustering Algorithms to Modularize IEC 61499 Control Software

Bauer, P., Sonnleithner, L., Kutsia, E., Rabiser, R. & Zoitl, A., Oct 2023, Proceedings of the 28th IEEE IES International Conference on Emerging Technologies and Factory Automation (ETFA 2023). New York, NY, United States: IEEE, p. 1-4 4 p. (IEEE International Conference on Emerging Technologies and Factory Automation, ETFA; vol. 2023-September).

Research output: Chapter in Book/Report/Conference proceeding › Conference proceedings › peer-review

Using Tool Support to Visualize and Interact with IEC 61499 Control Software

Bauer, P., Sonnleithner, L., Kutsia, E., Rabiser, R. & Zoitl, A., Oct 2023, Proceedings of the 28th IEEE IES International Conference on Emerging Technologies and Factory Automation (ETFA 2023). New York, NY, United States: IEEE, p. 1-8 8 p. (IEEE International Conference on Emerging Technologies and Factory Automation, ETFA; vol. 2023-September).

Research output: Chapter in Book/Report/Conference proceeding › Conference proceedings › peer-review

V4rdiac: Tooling for Multidisciplinary Delta-Oriented Variability Management in Cyber-Physical Production Systems

Fadhlillah, H., Feichtinger, K., Bauer, P., Kutsia, E. & Rabiser, R., 12 Sept 2022, Proceedings of the 26th ACM International Systems and Software Product Line Conference (SPLC 2022). Felfernig, A., Fuentes, L., Cleland-Huang, J., Assuncao, W. K. G., Assuncao, W. K. G., Quinton, C., Guo, J., Schmid, K., Huchard, M., Ayala, I., Rojas, J. M., Le, V.-M. & Horcas, J. M. (eds.). New York, USA: ACM, p. 34-37 4 p. (26th ACM International Systems and Software Product Line Conference, SPLC 2022 - Proceedings; vol. B).

Research output: Chapter in Book/Report/Conference proceeding › Conference proceedings › peer-review

Do you smell it too? Towards Bad Smells in IEC 61499 Applications

Sonnleithner, L., Bacsi, S., Oberlehner, M., Kutsia, E. & Zoitl, A., Dec 2021, Proceedings - 2021 26th IEEE International Conference on Emerging Technologies and Factory Automation, ETFA 2021. New York, USA: IEEE, p. 1-4 4 p. (IEEE International Conference on Emerging Technologies and Factory Automation, ETFA; vol. 2021-September).

Research output: Chapter in Book/Report/Conference proceeding › Conference proceedings › peer-review