Research output per year
Research output per year
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Flexible Variability Mining for IEC 61499 Control Software Applications with Varflix
Stummer, A., Hager, A.-L. & Rabiser, R., 01 Sept 2025, Proceedings of the 29th ACM International Systems and Software Product Line Conference - Volume B. Luaces, M. R., Rodeiro, T. V., Greiner, S., Galindo Duarte, J., Yue, T., Yoshimura, K., Semini, L., Cordy, M., Azanza, M., Kruger, J., Perrouin, G., Fortz, S., Groher, I., Munoz, D.-J., Schmid, K., Perez, F., Galasso-Carbonnel, J., Horcas, J. M. & Feichtinger, K. (eds.). New York, NY, USA: Association for Computing Machinery, p. 57–65 9 p. (SPLC-B '25).Research output: Chapter in Book/Report/Conference proceeding › Conference proceedings › peer-review
Open Access -
Variability Mining in IEC 61499
Hager, A.-L., 16 Jun 2025, 81 p.Research output: Thesis › Master's / Diploma thesis
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Towards a Flexible Approach for Variability Mining
Stummer, A., Hager, A.-L. & Rabiser, R., 02 Sept 2024, SPLC 2024 - 28th ACM International Systems and Software Product Line Conference, Proceedings. Cordy, M., Struber, D., Struber, D., Pinto, M., Groher, I., Dhungana, D., Kruger, J., Alves Pereira, J., Acher, M., Thum, T., Thum, T., ter Beek, M. H., Galasso-Carbonnel, J., Arcaini, P., Mousavi, M. R., Ternava, X., Galindo, J. A., Yue, T., Fuentes, L. & Horcas, J. M. (eds.). New York, NY, United States: ACM, p. 75-81 7 p. (ACM International Conference Proceeding Series).Research output: Chapter in Book/Report/Conference proceeding › Conference proceedings › peer-review
Open Access -
Variability-Driven Knowledge Discovery in IEC 61499 Systems
Hager, A.-L., Sharma, S. & Sonnleithner, L., Oct 2024, Proceedings of the IEEE International Conference on Emerging Technologies and Factory Automation (ETFA 2024). Facchinetti, T., Cenedese, A., Bello, L. L., Vitturi, S., Sauter, T. & Tramarin, F. (eds.). New York, USA: IEEE, p. 1-4 4 p. (IEEE International Conference on Emerging Technologies and Factory Automation, ETFA).Research output: Chapter in Book/Report/Conference proceeding › Conference proceedings › peer-review
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IEC 61499 Skill-based Distributed Design Pattern
Sonnleithner, L., Hager, A.-L., Meixner, K. & Zoitl, A., Oct 2023, 2023 IEEE 28th International Conference on Emerging Technologies and Factory Automation, ETFA 2023. New York, NY, United States: IEEE, p. 1-8 8 p. (IEEE International Conference on Emerging Technologies and Factory Automation, ETFA; vol. 2023-September).Research output: Chapter in Book/Report/Conference proceeding › Conference proceedings › peer-review