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XPS-Tiefenprofilierung mittels Ionenbeschuss: Herausforderungen und Grenzen in der Analytik von Oberflächen und Schichtsystemen
Roland Steinberger (Speaker)
J Walter (Speaker)
Martin Arndt (Speaker)
T. Greunz (Speaker)
Duchoslav, J.
(Speaker)
T. Steck (Speaker)
Josef Faderl (Speaker)
Stifter, D.
(Speaker)
Center for Surface and Nanoanalytics
Activity
:
Talk or presentation
›
Contributed talk
›
unknown
Period
06 Jul 2015
Event title
unbekannt/unknown
Event type
Conference
Location
Austria
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Fields of science
103020 Surface physics
210006 Nanotechnology
103021 Optics
JKU Focus areas
Engineering and Natural Sciences (in general)