XPS-Tiefenprofilierung mittels Ionenbeschuss: Herausforderungen und Grenzen in der Analytik von Oberflächen und Schichtsystemen

  • Roland Steinberger (Speaker)
  • J Walter (Speaker)
  • Martin Arndt (Speaker)
  • T. Greunz (Speaker)
  • Duchoslav, J. (Speaker)
  • T. Steck (Speaker)
  • Josef Faderl (Speaker)
  • Stifter, D. (Speaker)

Activity: Talk or presentationContributed talkunknown

Period06 Jul 2015
Event titleunbekannt/unknown
Event typeConference
LocationAustriaShow on map

Fields of science

  • 103020 Surface physics
  • 210006 Nanotechnology
  • 103021 Optics

JKU Focus areas

  • Engineering and Natural Sciences (in general)