Usage of ESD Detector Circuit for Analyzing Soft Failu res in IC cores

Activity: Talk or presentation › Contributed talk › science-to-science

Description

Due to ESD events on powered ICs, soft failures can occur in the IO pad frame and in the core of the IC. A detector cell can be used to detect these faults and distinguish between valid signal changes and soft failures. A corresponding digital detector cell with adjusted switching thresholds is presented in this paper. Since the detector cell is correspondingly small (150μm × 16.5μm), it can be placed several times in the IC and read out via a scan chain.
Period25 May 2018
Event title2018 IEEE 22nd Workshop on Signal and Power Integrity (SPI)
Event typeConference
LocationFranceShow on map

Fields of science

  • 202 Electrical Engineering, Electronics, Information Engineering
  • 102 Computer Sciences

JKU Focus areas

  • Mechatronics and Information Processing