SURFACE INSPECTION AND SEGMENTATION BASED ON LOCAL REFLECTIVITY PROPERTIES

  • Veronika Putz (Speaker)

Activity: Talk or presentation › Contributed talk › unknown

Description

Abstract: Image processing based surface inspection systems operate on various clues derived from a wide range of surface characteristics like gray–level values, color hues, polarization features, clues from stereoscopic views to name just a few. In this work we present image processing algorithms that allow an image segmentation on the characteristics the local reflection indicatrix is able to provide. Surface areas can be segmented into specular or diffusely reflecting zones as well as in zones determined by the direction of the local surface normal.
Period30 Aug 2006
Event titleunbekannt/unknown
Event typeConference
LocationSpainShow on map

Fields of science

  • 202039 Theoretical electrical engineering
  • 202016 Electrical engineering
  • 202027 Mechatronics
  • 202037 Signal processing
  • 202015 Electronics
  • 202036 Sensor systems
  • 202014 Electromagnetism
  • 202024 Laser technology
  • 202 Electrical Engineering, Electronics, Information Engineering
  • 202012 Electrical measurement technology
  • 202022 Information technology
  • 202021 Industrial electronics
  • 103021 Optics
  • 203016 Measurement engineering
  • 211908 Energy research
  • 101014 Numerical mathematics
  • 102003 Image processing