Structural Characterization of SiGe islands based on x-ray scattering diffraction techniques

  • Stangl, J. (Speaker)
  • Eugen Wintersberger (Speaker)
  • Jiri Novak (Speaker)
  • Gang Chen (Speaker)
  • Zhenyang Zhong (Speaker)
  • Schäffler, F. (Speaker)
  • Vaclav Holy (Speaker)
  • Bauer, G. (Speaker)
  • Marie-Ingrid Richard (Speaker)
  • Tobias Schülli (Speaker)
  • Gilles Renaud (Speaker)
  • Vincent Favre-Nicolin (Speaker)
  • Till Hartmut Metzger (Speaker)

Activity: Talk or presentationInvited talkunknown

Period18 Sept 2006
Event titleunbekannt/unknown
Event typeConference
LocationItalyShow on map

Fields of science

  • 103009 Solid state physics
  • 103018 Materials physics
  • 103 Physics, Astronomy
  • 103040 Photonics
  • 202032 Photovoltaics
  • 103011 Semiconductor physics
  • 210006 Nanotechnology
  • 103017 Magnetism