Soft failures in integrated circuits as a matter of ESD events

Description

Due to ESD events in powered ICs “soft failures” could occur in the input/output cells of the padframe or in the IC core itself. As shown in this paper, soft failures can occur despite corresponding standard ESD protective structures. In order to detect these disturbances and to distinguish between valid signal changes and bit errors, a corresponding digital detector with adjusted switching thresholds is presented. Since the detector cell is correspondingly small (150μm × 16.5μm), it can be placed several times in the IC and read out via a scan chain.

Period	06 Jun 2018
Event title	2018 International Conference on IC Design & Technology (ICICDT)
Event type	Conference
Location	ItalyShow on map