Non-destructiv, quantitative analysis of the Ge concentration in a SiGe quantum well, by means of low energy RBS

  • Markus Draxler (Speaker)

Activity: Talk or presentationPoster presentationunknown

Period26 Jun 2005
Event titleunbekannt/unknown
Event typeConference
LocationSpainShow on map

Fields of science

  • 103009 Solid state physics
  • 103008 Experimental physics
  • 202036 Sensor systems
  • 103018 Materials physics
  • 103 Physics, Astronomy
  • 202012 Electrical measurement technology
  • 503015 Subject didactics of technical sciences
  • 210004 Nanomaterials
  • 210001 Nanoanalytics
  • 103020 Surface physics
  • 103013 Ion physics
  • 103023 Polymer physics
  • 104018 Polymer chemistry
  • 103021 Optics
  • 103017 Magnetism
  • 203016 Measurement engineering
  • 103005 Atomic physics
  • 104014 Surface chemistry
  • 103015 Condensed matter