Exploration of the critical thickness of Ge-rich SiGe films by low-temperature molecular beam epitaxy

  • Enrique Prado-Navarrete (Speaker)

Activity: Talk or presentationPoster presentationscience-to-science

Period13 Sept 2022
Event title19th International Conference on Gettering and Defect Engineering in Semiconductor Technology (GADEST-19)
Event typeConference
LocationAustriaShow on map

Fields of science

  • 103 Physics, Astronomy

JKU Focus areas

  • Digital Transformation