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Calibration of a Flexible High Precision Power-On Reset during Production Test

  • Gerald Hilber (Speaker)

Activity: Talk or presentation › Contributed talk › unknown

Description

This paper describes a Power-On Reset (POR) circuit with very accurate threshold voltage levels. These voltage levels are achieved by calibrating an on-chip programmable voltage reference during the wafer sort or final test. Two different calibration methods are proposed. One which calibrates the reference voltage of a comparator and another method which calibrates the POR threshold voltage levels itself. Not only the variation of the POR threshold voltage levels can be reduced from 90mV to 7mV, but also the absolute value can be changed.
Period07 Nov 2012
Event titleInternational Test Conference 2012
Event typeConference
LocationUnited StatesShow on map

Fields of science

  • 202006 Computer hardware
  • 202028 Microelectronics
  • 102005 Computer aided design (CAD)
  • 202037 Signal processing
  • 202018 Semiconductor electronics

JKU Focus areas

  • Computation in Informatics and Mathematics
  • Nano-, Bio- and Polymer-Systems: From Structure to Function
  • Mechatronics and Information Processing