Automatic Test Pattern Generation for Multiple Missing Gate Faults in Reversible Circuits

Description

Logical reversibility is the basis for emerging technologies like quantum computing, may be used for certain aspects of low-power design, and has been proven beneficial for the design of encoding/decoding devices. Testing of circuits has been a major concern to verify the integrity of the implementation of the circuit. In this paper, we propose the main ideas of an ATPG method for detecting two missing gate faults. To that effect, we propose a systematic flow using Binary Decision Diagrams (BDDs). Initial experimental results demonstrate the efficacy of the proposed algorithms in terms of scalability and coverage of all testable faults.

Period	11 Jul 2017
Event title	Conference on Reversible Computation
Event type	Conference
Location	AustriaShow on map