A Low-Cost Spectrometer Based on Stress Induced Birefringence

Description

This paper presents a novel approach on spectroscopy using stress induced birefringence. The presented measurement set-up requires only a collimated light source, a transparent optical medium with a high photo-elastic constant placed between crossed polarizers, and an area scan camera or a line scan sensor. The spectrum of the transmitted light is calculated by solving a convex optimization problem using data from the emerging fringe pattern due to the mechanical loading of the optical component. In this preliminary work, a setup is presented which is able to measure spectra in the visible region of the spectrum. However, the same principle can be easily adapted for the infrared region.

Period	30 May 2017
Event title	Sensor+Test 2017
Event type	Conference
Location	GermanyShow on map