A Laser–Speckle Correlation Technique for Thickness Determination of Optically Thin Transparent Layers

Johannes Lettner (Speaker)

Institute of Measurement Technology

Activity: Talk or presentation › Contributed talk › unknown

Description

We present a method determining thicknesses of thin polar liquids on rough surfaces. Results of the reproducibility of measurements of coatings down to the $\mu$m range, which is less than the surface roughness are shown.

Period	20 Oct 2011
Event title	Frontiers in Optics/Laser Science XXVII 2011
Event type	Conference
Location	United StatesShow on map

Fields of science

202024 Laser technology
205016 Materials testing
203016 Measurement engineering
102003 Image processing

JKU Focus areas

Mechatronics and Information Processing