ULTRASOUND MICROSCOPY TECHNIQUES TO DETECT DELAMINATION IN STACKED LAYERS

Stefan Rupitsch; Bernhard Zagar

ULTRASOUND MICROSCOPY TECHNIQUES TO DETECT DELAMINATION IN STACKED LAYERS

Stefan Rupitsch
, Bernhard Zagar

Institut für Elektrische Messtechnik

Publikation: Beitrag in Buch/Bericht/Konferenzband › Konferenzbeitrag › Begutachtung

Abstract

We present the theory and some applica- tions of the synthetic aperture focusing technique applied to single transducer ultrasonic data sets. In this tech- nique a virtual source located at the geometrical focal point of the physical transducer is algorithmically gen- erated and thus allows for tighter focusing over a geo- metrically larger scan volume. We present results from a structural test phantom (two copper wires) and a de- laminated specimen.

Originalsprache	Englisch
Titel	IMEKO XVIII World Congress
Seitenumfang	6
Publikationsstatus	Veröffentlicht - 2006

Wissenschaftszweige

101014 Numerische Mathematik
102003 Bildverarbeitung
103021 Optik
202 Elektrotechnik, Elektronik, Informationstechnik
202012 Elektrische Messtechnik
202014 Elektromagnetismus
202015 Elektronik
202016 Elektrotechnik
202021 Industrielle Elektronik
202022 Informationstechnik
202024 Lasertechnik
202027 Mechatronik
202036 Sensorik
202037 Signalverarbeitung
202039 Theoretische Elektrotechnik
203016 Messtechnik
211908 Energieforschung

Dieses zitieren

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