Strain characterization of HG1-xFexSe-layers by electron spin resonance

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@article{f1b5a1998e264e858ccee4a0e998fa7a,

title = "Strain characterization of HG1-xFexSe-layers by electron spin resonance",

author = "W. Helzel and G. Hendorfer and Wolfgang Jantsch and Li, \{J. H.\} and K. Lischka and D. Schikora and T. Widmer and Z. Wilamowski",

year = "1998",

language = "English",

journal = "Materials Science Forum",

issn = "0255-5476",

publisher = "Trans Tech Publications Ltd, Switzerland",

}